Proceedings of Microscopy & Microanalysis 2013
Instrumentation Sciences
A17.02 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences
Abstract
Visualizing and Correcting Dynamic Specimen Processes in TEM Using a Direct Detection Device
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- 09 October 2013, pp. 1320-1321
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Development of a Cathodoluminescence Detection System for the (S)TEM Demonstrating Sub-nm Spatial and Sub-meV Spectral Resolution
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- 09 October 2013, pp. 1322-1323
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A17.P1 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences
Abstract
TEM Sample Preparation Made Easier: Ar Ion Mill that Counts Reflected Light Fringes and Runs Recipes Automatically
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- 09 October 2013, pp. 1324-1325
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Application of Low Energy Broad Ion Beam Milling to Improve the Quality of FIB Prepared TEM Samples
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- 09 October 2013, pp. 1326-1327
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Applications of 40-120kV Analytical TEM for Nanoscience
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- 09 October 2013, pp. 1328-1329
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Development of a New High Throughput 120 kV-TEM
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- 09 October 2013, pp. 1330-1331
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One FIB Does It All: From Massive Ablation to Nanometer Precision
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- 09 October 2013, pp. 1332-1333
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Advances in Low Voltage Electron Microscopy from Imaging to Analytical Perspective
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- 09 October 2013, pp. 1334-1335
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Application of Low Temperature Broad Ion Milling for Crystallographic Orientation Analysis of Biocalcite
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- 09 October 2013, pp. 1336-1337
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Advances in Remote Plasma Cleaning of Electron Microscopes and Charged Beam Instruments
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- 09 October 2013, pp. 1338-1339
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Latest Developments in Tools for Life and Materials Sciences: Quorum Technologies Ltd Recent Improvements to existing Coater Instrumentation
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- 09 October 2013, pp. 1340-1341
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FS-8500 Provides Superior Specimen Preparation
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- 09 October 2013, pp. 1342-1343
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New Tools for Correlative Light and Electron Microscopy
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- 09 October 2013, pp. 1344-1345
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Cathodoluminescence Detectors Suitable for Easy and Fast Analysis in Geosciences
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- 09 October 2013, pp. 1346-1347
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Take-Off Angle Imaging to Improve Correlation between BSE images and X-ray Maps and to Facilitate Mapping of Samples with Macro-scale Topography
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- 09 October 2013, pp. 1348-1349
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Measurements of the X-ray Transmission Characteristics of Moxtek's AP3 X-Ray Windows
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- 09 October 2013, pp. 1350-1351
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Small Angle X-Ray Scattering: Getting the Big Picture of the Very Small
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- 09 October 2013, pp. 1352-1353
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THE NANOWORKBENCH: Automated Nanorobotic System Inside of Scanning Electron or Focused Ion Beam Microscopes
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- 09 October 2013, pp. 1354-1355
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A18.01 Holography
Abstract
Distinguishing P-N Junction and Schottky Barrier in a Working Silicon Nanowire Diode
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- 09 October 2013, pp. 1356-1357
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Towards Mapping Electrostatic Potentials in Semiconductor Devices Under Working Conditions Using Off-Axis Electron Holography
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- 09 October 2013, pp. 1358-1359
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