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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 34 of 52

Instrumentation Sciences

A17.02 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Abstract

  • Visualizing and Correcting Dynamic Specimen Processes in TEM Using a Direct Detection Device

  • B.E. Bammes, D.-H. Chen, L. Jin, R.B. Bilhorn
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1320-1321
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A17.P1 Vendor Symposium: Latest Developments in Tools for Life and Materials Sciences

Abstract

  • TEM Sample Preparation Made Easier: Ar Ion Mill that Counts Reflected Light Fringes and Runs Recipes Automatically

  • A. Pakzad
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Application of Low Energy Broad Ion Beam Milling to Improve the Quality of FIB Prepared TEM Samples

  • A. Pakzad, S. Mick, C. Vartuli, J. Chung, G. Lian
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1326-1327
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Applications of 40-120kV Analytical TEM for Nanoscience

  • T. Kubo, H. Kobayashi, T. Hashimoto, M. Okada, M. Kondo, K. Nakano, M. Wayama, T. Kamino
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1328-1329
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Development of a New High Throughput 120 kV-TEM

  • Y. Ikeda, T. Kaneko, K. Ichikawa, Y. Tuzuku, K. Tanaka, G. Utsuno, T. Naganuma, C. Hamamoto
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1330-1331
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • One FIB Does It All: From Massive Ablation to Nanometer Precision

  • C. Kübler, K. Fladischer, K. Schultheiß, R. Hill
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1332-1333
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Advances in Low Voltage Electron Microscopy from Imaging to Analytical Perspective

  • P. Woo, M. Ohno, S. Takeuchi, R. Gauvin, N. Brodusch, H. Demers
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1334-1335
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Application of Low Temperature Broad Ion Milling for Crystallographic Orientation Analysis of Biocalcite

  • J.J. Clarke
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1336-1337
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Advances in Remote Plasma Cleaning of Electron Microscopes and Charged Beam Instruments

  • R. Vane
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1338-1339
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Latest Developments in Tools for Life and Materials Sciences: Quorum Technologies Ltd Recent Improvements to existing Coater Instrumentation

  • P.R. Missing, R.C. Hennig, H.M. Dyson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1340-1341
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • FS-8500 Provides Superior Specimen Preparation

  • D.L. Bentley, G. Seo
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1342-1343
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • New Tools for Correlative Light and Electron Microscopy

  • M. Langhorst, A. Yakushevska, B. Lich
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1344-1345
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Cathodoluminescence Detectors Suitable for Easy and Fast Analysis in Geosciences

  • J. Jiruše, J. Kološová, J. Leichmann
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1346-1347
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Take-Off Angle Imaging to Improve Correlation between BSE images and X-ray Maps and to Facilitate Mapping of Samples with Macro-scale Topography

  • N.C. Barbi, A. Muto
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1348-1349
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Measurements of the X-ray Transmission Characteristics of Moxtek's AP3 X-Ray Windows

  • R.T. Creighton, S. Liddiard, S. Cornaby
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1350-1351
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Small Angle X-Ray Scattering: Getting the Big Picture of the Very Small

  • P. Panine, M. Fernandez-Martinez, S. Rodrigues, R. Mahe, F. Bossan, P. Høghøj
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1352-1353
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • THE NANOWORKBENCH: Automated Nanorobotic System Inside of Scanning Electron or Focused Ion Beam Microscopes

  • I. Burkart, V. Klocke, E. Maynicke
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1354-1355
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A18.01 Holography

Abstract

  • Distinguishing P-N Junction and Schottky Barrier in a Working Silicon Nanowire Diode

  • K. He, J.-H. Cho, Y. Jung, M. Reed, T. Picraux, J. Cumings
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1356-1357
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 34 of 52