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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 31 of 52

Instrumentation Sciences

A14.P1 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • 3D ChemiSTEM™ Tomography of Secondary and Tertiary γ' Precipitates in Ni-based Superalloys

  • R. Chowdhury, J.M. Sosa, R.E. Williams, H.L. Fraser, D.W. McComb
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1200-1201
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Evaluating long-term stability and transient disturbances of a TEM

  • M. Malac, R.A. McLeod, Y. Taniguchi, M. Bergen, D. Hoyle
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1202-1203
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Enhanced Angular Topographic Backscatter Electron Filtering

  • D. Phifer, J. Pecher, P. Valasek, M. Petrek, T. Vystavel
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1204-1205
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atomic Structure and Chemistry of Defects in non-stoichiometric SrVO3 Thin Films

  • H. Mohammad Alipour, R.M. White, C. Eaton, J.A. Moyer, R. Engel-Herbret, J.M. LeBeau
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1206-1207
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A15.01 Low Voltage Transmission Microscopy: Pros and Cons

Abstract

  • Application of Low Voltage Transmission Electron Microscopy

  • D.C. Bell
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1208-1209
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Pros and Cons of Low-kV Transmission Electron Microscopy

  • R. Egerton
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1212-1213
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A15.02 Low Voltage Transmission Microscopy: Pros and Cons

Abstract

  • Quantitative Low-Voltage STEM imaging in the Presence of Temporal Incoherence

  • M.P. Oxley, S.J. Pennycook
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1216-1217
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Current Status of the Sub-Angstrom Low-Voltage Electron Microscopy (SALVE) Project

  • U.A. Kaiser
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1218-1219
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low-Voltage TEM/STEM for Atomic Resolution Imaging and Spectroscopy

  • K. Suenaga, T. Sasaki, H. Sawada
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1220-1221
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low-Voltage Atomic-Resolution Off-Axis Holography on Hexagonal Boron Nitride

  • M. Linck, P. Ercius, C. Ophus, N. Alem, A. Zettl, U. Dahmen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1222-1223
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A15.P1 Low Voltage Transmission Microscopy: Pros and Cons

Abstract

  • Imaging Atomic Dynamics in 2D Silica Glass with Low-Voltage Aberration-Corrected TEM

  • P.Y. Huang, J.S. Alden, S. Kurasch, A. Shekhawat, A.A. Alemi, J.P. Sethna, U. Kaiser, D.A. Muller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1224-1225
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy

  • J.M. Yuk, H.Y. Jeong, N.Y. Kim, M.J. Lee, J.Y. Lee, Z. Lee
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1226-1227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Physical Limitations on Transmission Electron Microscope Imaging of Lithium Battery Materials

  • B.D. Levin, D.A. Muller
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1228-1229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Spectroscopic Studies on Nitrogen-doped Multi-Walled Carbon Nanotubes Using Monochromated STEM-EELS at Low-Voltage

  • R. Arenal
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1230-1231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low Voltage STEM for the Study of Defects in 2D Materials

  • W. Zhou, J. Lee, M.D. Kapetanakis, M.P. Prange, A.R. Lupini, S.T. Pantelides, J.-C. Idrobo, S.J. Pennycook
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1232-1233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Contrast Enhancement in Low-kV Zero-loss Filtered Imaging of Frozen-hydrated Biological Specimen

  • E. Majorovits, G. Hofhaus, I. Angert, G. Benner, U. Kaiser, R.R. Schröder
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1234-1235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low Energy Scanning Transmission Electron Microscope

  • I. Mullerova, E. Mikmekova, I. Konvalina, L. Frank
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1236-1237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 31 of 52