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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 30 of 52

Instrumentation Sciences

A14.04 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • High Brightness Photocathodes for Ultrafast TEM: A New Paradigm

  • B.L. Rickman, J.A. Berger, A.W. Nicholls, W.A. Schroeder
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1162-1163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A14.05 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Addition, Subtraction, and Analysis of Orbital Angular Momentum in Electron Vortex Beams

  • T. Yahn, J.S. Pierce, T.R. Harvey, B.J. McMorran
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1166-1167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Production of Vortex Beam Modes from a Magnetic Spiral Phase Plate

  • A.M. Blackburn, J.C. Loudon
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1168-1169
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Reducing Transient Electric Fields Effect in Ultrafast Electron Diffraction Using Multiple Laser Pulse Train

  • Y. Hu, J. Li, J.-M. Zuo
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1170-1171
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A14.06 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Developments in environmental transmission electron microscopy for catalysis research

  • E.A. Stach, D. Zakharov, M.C. Akatay, P. Baumann, F. Ribeiro, Y. Zvienevich, Y. Li, A. Frenkel
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1174-1175
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High contrast BSE Imaging under Ultra Low Voltage condition by FE-SEM with Energy Filtering

  • Y. Hashimoto, T. Matsuzaki, H. Ito, M. Konno, S. Takeuchi
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1176-1177
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Position-sensitive STEM detectors for high-sensitivity phase detection

  • T.J. Pennycook, L. Jones, P.D. Nellist
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1180-1181
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • New Low Voltage Scanning Transmission Electron Microscope Detector for Fastest Image Acquisition in BF, DF and HAADF

  • R. Salzer, J. Ackermann, R. Arnold, S. Meyer, C. Kübler
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1182-1183
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A14.P1 New Instrumentation at the Limits: Characteristics and Applications

Abstract

  • Multislice Simulation of Dynamical Elastic Scattering and Orbital Angular Momentum of Vortex Beams in Crystals

  • L. Xie, P. Wang, X. Pan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1184-1185
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electron Orbital Angular Momentum Transfer to Nanoparticle Plasmon Modes

  • T.R. Harvey, J.S. Pierce, T.S. Yahn, P.A. Ercius, B.J. McMorran
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1186-1187
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High Efficiency Electron Diffractive Optics

  • J.S. Pierce, T.R. Harvey, T.S. Yahn, B.J. McMorran
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1188-1189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Evaluation of a Multi-pixel CMOS Photon Detector

  • J.H. Chuah, D.M. Holburn, B.C. Breton, N. Caldwell
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1190-1191
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • On Achromatic Probe-Forming Lenses for FIB Columns and Helium Microscopes

  • F.W. Martin
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1194-1195
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Estimation of Energy Acceptance of SE Detectors in Scanning Electron Microscopy

  • K. Kumagai, T. Sekiguchi
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1196-1197
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • How Flat is Your Detector? Non-Uniform Annular Detector Sensitivity in STEM Quantification

  • K.E. MacArthur, L. Jones, P.D. Nellist
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1198-1199
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 30 of 52