Proceedings of Microscopy & Microanalysis 2013
Instrumentation Sciences
A13.01 Microscopy and Microanalysis for Real World Problem Solving
Abstract
Rapid Design of an Annealing Heat Treatment through a Combination of Microanalysis and Modeling
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- 09 October 2013, pp. 1040-1041
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Characterization of Dislocations Found in an Array at a Mixed Character Small Angle Boundary of a Cross Rolled and Annealed Aluminium Sample
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- 09 October 2013, pp. 1042-1043
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A13.02 Microscopy and Microanalysis for Real World Problem Solving
Abstract
Optimizing Fuel Cell Materials through Electron Microscopy and Microanalysis
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- 09 October 2013, pp. 1044-1045
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Quantitative Differentiation of Three Iron Oxides by EDS
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- 09 October 2013, pp. 1046-1047
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Quantitative Analysis of Carbon in Carbon Steel Using SEM/EDS Followed by Error Correction Approach
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- 09 October 2013, pp. 1048-1049
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Examination of Polycrystalline Diamond Compact Cutter used in Drilling Tools in the Oil Industry
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- 09 October 2013, pp. 1050-1051
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Single Crystal Elastic Constants of TWIP Steel Determined From Nanoindentation
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- 09 October 2013, pp. 1052-1053
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A13.03 Microscopy and Microanalysis for Real World Problem Solving
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Discovery: Under the Microscope at Kennedy Space Center
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- 09 October 2013, pp. 1054-1055
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Understanding Complex Material Systems Using Multiple Characterization Techniques
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- 09 October 2013, pp. 1056-1057
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Integrated Nonlinear Optical Microscope for Crystal Centering on a Synchrotron X-ray Beamline
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- 09 October 2013, pp. 1058-1059
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Low kV Imaging using Charge Balancing
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- 09 October 2013, pp. 1060-1061
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Microscopy Method for Characterization Oil Uptake in Fried Foods
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- 09 October 2013, pp. 1062-1063
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A13.04 Microscopy and Microanalysis for Real World Problem Solving
Abstract
Understanding the Effects of Wear Particles: Lessons Learned from Postmortem Retrievals
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- 09 October 2013, pp. 1064-1065
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Use of an Automated SEM to Detect Laboratory Contamination
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- 09 October 2013, pp. 1066-1067
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Quantitative X-ray Photoelectron Spectroscopy Imaging for Small Feature Compositional Screening
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- 09 October 2013, pp. 1068-1069
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Ultra-thin Iridium as a Replacement Coating for Carbon in High Resolution Quantitative Analyses of Insulating Specimens
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- 09 October 2013, pp. 1070-1071
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Focused Electron Beam and Elemental Mapping of Palm-top EPMA (Scanning) Equipped with CL Spectrometer (Projection)
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- 09 October 2013, pp. 1072-1073
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A13.05 Microscopy and Microanalysis for Real World Problem Solving
Abstract
Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM
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- 09 October 2013, pp. 1074-1075
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Nanometer-scale Characterization Tools for Strain-Engineered Semiconductor Devices
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- 09 October 2013, pp. 1076-1077
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Quantitation of Overlapping Core Edges in EFTEM Spectrum Imaging of Cells
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- 09 October 2013, pp. 1078-1079
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