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Focused Electron Beam and Elemental Mapping of Palm-top EPMA (Scanning) Equipped with CL Spectrometer (Projection)

Published online by Cambridge University Press:  09 October 2013

S. Imashuku ,
N. Fuyuno ,
A. Imanishi ,
K. Hanasaki ,
K. Ohira  and
J. Kawai
S. Imashuku
Affiliation:
N. Fuyuno
Affiliation:
A. Imanishi
Affiliation:
K. Hanasaki
Affiliation:
K. Ohira
Affiliation:
J. Kawai
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1072 - 1073
Copyright
Copyright © Microscopy Society of America 2013