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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 25 of 52

Instrumentation Sciences

A12.04 Atom Probe Tomography In Correlative Investigations

Abstract

  • Characterization of 3D Dopant Distribution in State of the Art FinFET Structures

  • M.S. Hatzistergos, M. Hopstaken, E. Kim, L. Vanamurthy, J.F. Shaffer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 960-961
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Probe Tomography of Grain Boundaries in Ion Conducting Oxides

  • D.R. Diercks, B.P. Gorman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 962-963
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A12.05 Atom Probe Tomography In Correlative Investigations

Abstract

  • Complementary Atom Probe Tomography and Electron Microscopy of Oxidation of Ni-Base Alloys in High-Temperature Water Environments

  • D.K. Schreiber, M.J. Olszta, S.M. Bruemmer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 970-971
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Correlated APT and TEM Approach to Understand Nanostructured Ferritic Alloys

  • M.K. Miller, C.M. Parish, L. Yao
  • Published online by Cambridge University Press:
    09 October 2013, pp. 972-973
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A12.06 Atom Probe Tomography In Correlative Investigations

Abstract

A12.P1 Atom Probe Tomography In Correlative Investigations

Abstract

  • Multi-Region Data Simulation for Detection Limit Investigations in IVAS™

  • R.M. Ulfig, B.P. Geiser, T.J. Prosa, D.J. Larson, J. Leroux, B. Dupont
  • Published online by Cambridge University Press:
    09 October 2013, pp. 986-987
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Effects of Detector Efficiency on Distinguishing Solute Atoms in Random Solid Solution and Solute Clusters

  • M.K. Miller, L. Yao
  • Published online by Cambridge University Press:
    09 October 2013, pp. 988-989
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Voltage and Laser-Assisted Mode Atom Probe Tomography of Gallium Nitride

  • N. Dawahre, G. Shen, S.M. Kim, P. Kung
  • Published online by Cambridge University Press:
    09 October 2013, pp. 990-991
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Gaussian Kernel Density Estimator for Voxel Size Selection in Atom Probe Tomography

  • K. Kaluskar, K. Rajan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 992-993
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Improved Mass Resolving Power and Yield in Atom Probe Tomography

  • D.J. Larson, T.J. Prosa, J.H. Bunton, D.P. Olson, D.F. Lawrence, E. Oltman, S.N. Strennin, T.F. Kelly
  • Published online by Cambridge University Press:
    09 October 2013, pp. 994-995
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • A Weibull Perspective on the Fracture of Atom Probe Specimens

  • B. Gault, O. Bouaziz
  • Published online by Cambridge University Press:
    09 October 2013, pp. 996-997
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Simulation-Enhanced Atom Probe for Complete 3D Atomistic Imaging

  • M.P. Moody, A.V. Ceguerra, A.J. Breen, B. Gault, X.Y. Cui, L.T. Stephenson, R.K. Marceau, R. Powles, S.P. Ringer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 998-999
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 25 of 52