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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 28 of 52

Instrumentation Sciences

A13.05 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Determination of the Optical Properties of Carbonaceous Aerosols by Monochromated Electron Energy-loss Spectroscopy

  • J. Zhu, P.A. Crozier, J.R. Anderson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1080-1081
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electron Microscopy of Graphene Materials Produced by Combustion Synthesis

  • S. Rouvimov, K.V. Manukyan, A.S. Mukasyan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1082-1083
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Direct High Resolution Cryo-TEM Imaging of Liquid Crystals

  • M. Gao, C. Zhang, H.-S. Park, A. Jakli, O.D. Lavrentovich
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1084-1085
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A13.06 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Forensic Gemmology in Forensic Practice

  • M. Kotrly, I. Turkova
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1086-1087
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Low Voltage Silicon Drift Detector Microanalysis of the Mineral Tourmaline: Examples From the Black Hills, South Dakota

  • C.S. Schwandt
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1088-1089
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High-Performance DyBa2Cu3O7-x Superconducting Coated Conductors Grown by Inclined Substrate Deposition with Ic Exceeding 1000 A cm-1

  • Z. Aabdin, M. Dürrschnabel, O. Eibl
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1092-1093
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A13.P1 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Procedure for TEM Measurement of Nanoparticles

  • W.G. Stratton, M.I. Buckett, S. McKernan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1098-1099
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In-Situ Analytical Electron Microscopy Study of the Lithiation of TiO2 Nanowires Used in Li-Ion Batteries

  • M. Gu, B. Li, W. Wang, V. Sprenkle, C.-M. Wang
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1102-1103
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Identifying Minerals of Environmental Concern in Soils from Smelter Operations Using Multiple Microanalytical Methods

  • H.A. Lowers, D.J. Bove, S.A. Morman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1104-1105
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Auger Electron Spectroscopy of Carbon Diffusion Profiles in Low Temperature Carburized Stainless Steels

  • W. Jennings, A. Avishai, B. Cowen, H. Kahn, F. Ernst, A.H. Heuer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1106-1107
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Characterization of Graphite Inclusions in Cast Iron by Cathodoluminescence and X-Ray Microanalysis

  • S.A. Wight, J.R. Hitchings
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1110-1111
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Morphological Study on Electrochemical Sensor Based Polypyrrole by Scanning Electron Microscopy

  • G. Gonzalez-Mancera, J.L. Reyes, Q. Camacho
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1112-1113
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Confocal and SEM Studies of Protist Parasites on Fresh Produce

  • G.R. Bauchan, D. Macarisin, M. Santin, R. Fayer
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1114-1115
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Improved Specimen Preparation and SEM Imaging Reveal the Morphology of a West African Sorghum Resistant to Storage Insects

  • M.W. Pendleton, E.A. Ellis, B.B. Pendleton, N.Y. Diarisso
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1116-1117
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Reducing Charging Issues in Silicon on Insulator Cross Sections Under SEM

  • M. Ordway
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1118-1119
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 28 of 52