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Proceedings of Microscopy & Microanalysis 2013

Volume 19 - Issue S2 - August 2013
Contents

Page 26 of 52

Instrumentation Sciences

A12.P1 Atom Probe Tomography In Correlative Investigations

Abstract

  • Using Spatial Distribution Maps to Estimate APT Efficiency

  • B.P. Geiser, D.J. Larson, T.J. Prosa, T.F. Kelly, R.M. Ulfig
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1000-1001
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • An Integrated Data Driven Reconstruction and Molecular Dynamics Simulation for Lattice Structure in Atom Probe Tomography

  • J. Peralta, K. Kaluskar, C. Loyola, K. Rajan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1002-1003
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electric Field Induced Changes in Surface Bonding: Integrating First Principles and Atom Probe Tomography

  • C. Loyola, J. Peralta, S. Broderick, K. Rajan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1004-1005
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Stability of Oxygen-Enriched Nanoclusters and Helium Bubbles in Fe-Based Alloys under Extreme Conditions

  • M.K. Miller, C.-L. Fu, X. Chen, Q. Li
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1006-1007
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Influence of Co Underlayer Thickness on Mass Resolving Power in Field Evaporated Cu/Co Bilayer

  • K. Tippey, B.C. Hornbuckle, B. Fu, G.B. Thompson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1008-1009
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A12.P2 Atom Probe Tomography In Correlative Investigations

Abstract

  • Constraining Atom Probe Tomography Reconstructions of Crystalline Oxides

  • M.J. Cohen, L. Gordon, S. Suram, K. Kaluskar, K. Rajan, J.W. Valley, D. Joester
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1010-1011
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Characterization of the Influence of Grain Boundary Character on Oxidation of Nickel Using Atom Probe Tomography

  • S.L. Welsh, J.L. Evans
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1012-1013
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Probe Tomography Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode

  • T.J. Prosa, D. Olson, A.D. Giddings, W. Lefebvre, P.H. Clifton, D.J. Larson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1014-1015
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Probe Tomography Characterization of a White Etching Area in a Bearing Steel

  • J. Kang, C. Williams, B. Hosseinkhani, P.E. Rivera Diaz del Castillo, P.A. Bagot, M.P. Moody
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1016-1017
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Probe Tomography Characterization of Catalyst Nanoparticles

  • P.A. Bagot, T. Li, E. Tsang, G. Smith, M.P. Moody
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1018-1019
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Probe Characterization of Corroded Alloy 600

  • B. Gault, F. Scenini, M.P. Moody, J.H. Huang, G.A. Botton, D. Mangelinck, M. Descoins, R.C. Newman
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1020-1021
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom-Probe Tomographic Study of Precipitation in an Ultrafine-Grained Al-Zn-Mg-Cu Alloy (Al 7075)

  • H. Wen, K. Ma, D. Isheim, D.N. Seidman, J.M. Schoenung, E.J. Lavernia
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1024-1025
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • 3D Characterization Study of High-k Dielectric on GaN Using Atom Probe Tomography

  • B. Mazumder, X. Liu, U.K. Mishra, J.S. Speck
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1026-1027
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Application of Atom Probe Tomography to Atomic Layer Deposited Thin Films

  • A.D. Giddings, T.J. Prosa, T.F. Kelly, D.J. Larson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1028-1029
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atom Probe Tomography Study of In-Doped ZnO

  • M. Baram, M.N. Bachhav, A.H. Hunter, E.A. Marquis, D.C. Bell, X. Liang, D.R. Clarke
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1030-1031
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Methods for Micro-to-Nanometer Correlative Tomography

  • S. Gerstl, M. Lucas, E. Mueller, P. Gasser, R.A. Wepf
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1032-1033
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A13.01 Microscopy and Microanalysis for Real World Problem Solving

Abstract

  • Unraveling the Mystery:Using Microscopy in a Metallurgical Failure Investigation

  • S.A. Bradley, K.W. Hagglund, L. So, A. Stolarski, B.L. Tiemens
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1034-1035
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Microstructural Analysis of Crept Martensitic Steels

  • S. Swaminathan, M. Karadge, T. Vishwanath, R. Oruganti
  • Published online by Cambridge University Press:
    09 October 2013, pp. 1036-1037
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 26 of 52