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New Applications in Atom Probe Tomography

Published online by Cambridge University Press:  09 October 2013

D.J. Larson ,
J.W. Valley ,
T. Ushikubo ,
M.K. Miller ,
H. Takamizawa ,
Y. Shimizu ,
L.M. Gordon ,
D. Joester ,
D. Giddings  and
D.A. Reinhard
...Show all authors
D.J. Larson
Affiliation:
J.W. Valley
Affiliation:
T. Ushikubo
Affiliation:
M.K. Miller
Affiliation:
H. Takamizawa
Affiliation:
Y. Shimizu
Affiliation:
L.M. Gordon
Affiliation:
D. Joester
Affiliation:
D. Giddings
Affiliation:
D.A. Reinhard
Affiliation:
T.J. Prosa
Affiliation:
D.P. Olson
Affiliation:
D.F. Lawrence
Affiliation:
P.H. Clifton
Affiliation:
R.M. Ulfig
Affiliation:
I. Martin
Affiliation:
T.F. Kelly
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1022 - 1023
Copyright
Copyright © Microscopy Society of America 2013