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Low Voltage STEM for the Study of Defects in 2D Materials

Published online by Cambridge University Press:  09 October 2013

W. Zhou ,
J. Lee ,
M.D. Kapetanakis ,
M.P. Prange ,
A.R. Lupini ,
S.T. Pantelides ,
J.-C. Idrobo  and
S.J. Pennycook
W. Zhou
Affiliation:
J. Lee
Affiliation:
M.D. Kapetanakis
Affiliation:
M.P. Prange
Affiliation:
A.R. Lupini
Affiliation:
S.T. Pantelides
Affiliation:
J.-C. Idrobo
Affiliation:
S.J. Pennycook
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1232 - 1233
Copyright
Copyright © Microscopy Society of America 2013