High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach

S. Richter; P.T. Pinard; N. Mevemkamp; M. Torrilhon

doi:10.1017/S1431927613008477

High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach

Published online by Cambridge University Press: 09 October 2013

S. Richter ,

P.T. Pinard ,

N. Mevemkamp and

M. Torrilhon

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S. Richter: Affiliation:
P.T. Pinard: Affiliation:
N. Mevemkamp: Affiliation:
M. Torrilhon: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1296 - 1297

DOI: https://doi.org/10.1017/S1431927613008477 [Opens in a new window]

Article contents

High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach

Abstract

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