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XRD characterization of highly dispersed metal catalysts on carbon support

Published online by Cambridge University Press:  31 January 2011

Paolo Scardi  and
Pier Luigi Antonucci
Paolo Scardi
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, 38050 Mesiano, TN, Italy
Pier Luigi Antonucci
Affiliation:
CNR-Istituto di Ricerche sui Metodi e Processi Chimici per la Trasformazione e l'Accumulo dell'Energia, Via Salita S. Lucia sopra Contesse, 39-98126 S. Lucia, ME, Italy
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Abstract

Carbon-supported Pt catalysts were prepared from H2PtCl6 or K2PtCl6 aqueous solutions. Particle size and structure after several thermal activation treatments were studied by X-Ray Diffraction (XRD), Transmission Electron Microscopy (TEM), and Cyclic Voltammetry (CV), and the results of the three techniques were compared. As the catalysts were highly dispersed on an amorphous support, a conventional XRD profile analysis for crystallite size determination could not be performed properly, because of the strong overlapping between the broad Pt peaks superposed to the halos of the amorphous phase. Thus, a new procedure of whole XRD pattern fitting, based on the Rietveld method, was used to have reliable data of Pt particle size (surface area) and lattice parameter. All structural and microstructural parameters were refined within the same procedure, also considering the transparency of the carbon supported catalysts and minimizing the effect of the amorphous background. The method can also take into account the presence of bimodal particle size distributions, which is difficult to study by CV or TEM.

Type
Articles
Information
Journal of Materials Research , Volume 8 , Issue 8 , August 1993 , pp. 1829 - 1835
Copyright
Copyright © Materials Research Society 1993

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