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Topography analysis of grit-blasted and grit-blasted-acid-etched titanium implant surfaces using multi-scale measurements and multi-parameter statistics
Published online by Cambridge University Press: 31 January 2011
Abstract
Micro texturing of titanium implant surfaces is commonly used to enhance fixation by osseointegration, and devising robust and specific correlations between surface topographic features and implant performance is an area of active current research. In this context, we present a detailed analysis of the topographies of titanium surfaces prepared by grit blasting (GB) and grit blasting followed by acid etching (GB+AE) at two different imaging scales over a full range of statistical parameters. The surfaces were characterized using white light interferometry and atomic force microscopy, and the topographic images were processed to extract the amplitude, spatial, hybrid, and functional parameters of the surface. Although GB+AE surfaces are known to elicit significantly higher bone response than GB surfaces, the topographies differed by less than 20% (over all parameters) when averaged over 242 × 181 μm interferometric images. In contrast, measurements over smaller 25 × 25 μm areas obtained using high-resolution atomic force microscopy indicated that the GB+AE surfaces exhibit a 26% increase in root-mean-square (rms) roughness, a 63% increase in rms slope, a 75% increase in the curvature of the summits, and a 21% increase in surface area over GB surfaces. These results constitute the first identification of rms slope and summit curvatures as important topographic variables that must be considered in ongoing efforts to correlate surface topography with the performance of endosseous titanium implants.
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