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Local magnetic field distribution in polycrystalline YBa2Cu3O7 and its influence on bulk critical currents

Published online by Cambridge University Press:  31 January 2011

Thomas R. Askew ,
Richard B. Flippen ,
Kevin J. Leary  and
Milind N. Kunchur
Thomas R. Askew
Affiliation:
Central Research and Development Department, E.I. Du Pont de Nemours and Co., P.O. Box 80357, Wilmington, Delaware 19880–0357
Richard B. Flippen
Affiliation:
Central Research and Development Department, E.I. Du Pont de Nemours and Co., P.O. Box 80357, Wilmington, Delaware 19880–0357
Kevin J. Leary
Affiliation:
Jackson Laboratory, E. I. Du Pont de Nemours and Co., Deepwater, New Jersey 08023
Milind N. Kunchur
Affiliation:
Department of Physics, University of Virginia, Charlottesville, Virginia 22901
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Abstract

The transport critical current density Jc has been measured in high quality polycrystalline YBa2Cu3O7 samples made from extruded preforms. The hysteretic response of Jc to applied magnetic fields was studied as a function of temperature (77–87 K) and sample morphology for various field sweeps in the 0–5 KOe range. A variety of samples show a basic Jc ∼ H−n behavior where n depends on temperature, but is independent of the other variables. A simple model of the local magnetic field distribution is presented and compared to the data, and the theoretical implications of the power law behavior are considered.

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Articles
Information
Journal of Materials Research , Volume 6 , Issue 6 , June 1991 , pp. 1135 - 1147
Copyright
Copyright © Materials Research Society 1991

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References

1.Bednorz, J. G. and Müller, K. A., Z. Phys. B 64, 189 (1986).CrossRefGoogle Scholar
2.Muller, K. A., Takashige, M., and Bednorz, J. G., Phys. Rev. Lett. 58, 1143 (1987).CrossRefGoogle Scholar
3.Dinger, T. D., Worthington, T. K., Gallagher, W. J., and Sandstrom, R. L., Phys. Rev. Lett. 58, 2687 (1987).CrossRefGoogle Scholar
4.Peterson, R. L. and Ekin, J. W., Phys. Rev. B 37, 9848 (1988).CrossRefGoogle Scholar
5.Chaudhari, P., Mannhart, J., Dimos, D., Tsuei, C. C., Chi, C. C., Oprysko, M. M., and Scheuermann, M., Phys. Rev. Lett. 60, 1653 (1988).CrossRefGoogle Scholar
6.Dimos, D., Chaudhari, P., Mannhart, J., and LeGoues, F. K., Phys. Rev. Lett. 61, 219 (1988).CrossRefGoogle Scholar
7.Malozemoff, A. P., Worthington, T. K., Yeshurun, Y., Holtzberg, F., and Kes, P. H., Phys. Rev. B 38, 7203 (1988).CrossRefGoogle Scholar
8. For review and reference list see Malozemoff, A. P., “Macroscopic Magnetic Properties of High Temperature Superconductors,” in Physical Properties of High Temperature Superconductors I, edited by Ginsberg, D. M. (World Science, London, 1989), Chap. 3.Google Scholar
9.Flippen, R. B. and Askew, T. R., J. Appl. Phys. 67, 4515 (1990).CrossRefGoogle Scholar
10.Tinkham, M., Helv. Phys. Acta 61, 443 (1988).Google Scholar
11.Tinkham, M., Phys. Rev. Lett. 61, 1658 (1988).CrossRefGoogle Scholar
12.Tinkham, M., in High-Temperature Superconductors: Fundamental Properties and Novel Materials Processing, edited by Christen, D., Narayan, J., and Schneemeyer, L. (Mater. Res. Soc. Symp. Proc. 169, Pittsburgh, PA, 1990) p. 849.Google Scholar
13.Hampshire, D. P., Ikeda, J. A. S., and Chiang, Y. M., Phys. Rev. B 40, 8818 (1989).CrossRefGoogle Scholar
14.Koch, R. H., Foglietti, V., Gallagher, W. J., Koren, G., Gupta, A., and Fisher, M. P. A., Phys. Rev. Lett. 63, 1511 (1989).CrossRefGoogle Scholar
15.Morgenstern, I., IBM Jour. Res. Dev. 33, 307 (1989).CrossRefGoogle Scholar
16.Jin, S., Sherwood, R. C., Gyorgy, E. M., Tiefel, T. H., van Dover, R. B., Nakahara, S., Schneemeyer, L. F., Fastnacht, R. A., and Davis, M. E., Appl. Phys. Lett. 54, 584 (1989).CrossRefGoogle Scholar
17.Umezawa, A., Crabtree, G. W., Liu, J. Z., Weber, H. W., Kwok, W. K., Nunez, L. H., Moran, T. J., Sowers, C. H., and Claus, H., Phys. Rev. B 36, 7151 (1987).CrossRefGoogle Scholar
18.Wisinewski, A., Baran, M., Przystupski, P., Szymczak, H., Pajaczkaowska, A., Pytel, B., and Pytel, K., Solid State Commun. 65, 577 (1988).CrossRefGoogle Scholar
19.No, K., Verhoeven, J. D., McCallum, R. W., and Gibson, E. D., IEEE Trans. Magn. 25, 2184 (1989).CrossRefGoogle Scholar
20. References confined to transport J c measured by reasonable methods—for details see Ref. 63.Google Scholar
21.Cava, R. J., Batlogg, B., van Dover, R. B., Murphy, D. W., Sunshine, S., Siegrist, T., Remeika, J. P., Reitman, E. A., Zahurak, S., and Espinosa, G. P., Phys. Rev. Lett. 58, 1676 (1987).CrossRefGoogle Scholar
22.Matsuda, S., Okada, M., Morimoto, T., Matsumoto, T., and Aihara, K., in High-Temperature Superconductors, edited by Brodsky, M. B., Dynes, R. C., Kitazawa, K., and Tuller, H. L. (Mater. Res. Soc. Symp. Proc. 99, Pittsburgh, PA, 1988), p. 695.Google Scholar
23.Kiipfer, H., Apfelstedt, I., Fliikiger, R., Keller, C., Meier-Hirmer, R., Runtsch, B., Turowski, A., Wiech, U., and Wolf, T., Cryogenics 28, 650 (1988).CrossRefGoogle Scholar
24.Kawashima, M., Nagata, N., Hosoda, Y., Takano, S., Shibuta, N., Mukai, H., and Hikata, T., IEEE Trans. Magn. 25, 2168 (1989).CrossRefGoogle Scholar
25.Sadakata, N., Sugimoto, M., Kohno, O., and Tachikawa, K., IEEE Trans. Magn. 25, 2180 (1989).CrossRefGoogle Scholar
26.Alford, N. McN., Button, T. W., Gough, C. E., Wellhofer, F., O'Connor, D. A., Colclough, M. S., Pollard, R. J., and McCartney, D. G., J. Appl. Phys. 66, 5930 (1989).CrossRefGoogle Scholar
27.Osamura, K., Takayama, T., and Ochiai, S., Appl. Phys. Lett. 55, 396 (1989).CrossRefGoogle Scholar
28.Dai, U., Hess, N., Tessler, L. R., Deutscher, G., Vetter, G., Queyroux, F., Bontemps, N., Mahoum, R., Lagues, M., and Mocaer, P., Appl. Phys. Lett. 55, 1135 (1989).CrossRefGoogle Scholar
29.Kuwabara, M., Appl. Phys. Lett. 55, 2781 (1989).CrossRefGoogle Scholar
30.Tkaczyk, J. E. and Lay, K. W., J. Mater. Res. 5, 1368 (1990).CrossRefGoogle Scholar
31.Jin, S., Tiefel, T. H., Sherwood, R. C., van Dover, R. B., Davis, M. E., Kammlott, G. W., and Fastnacht, R. A., Phys. Rev. B 37, 7850 (1988).CrossRefGoogle Scholar
32.Jin, S., Tiefel, T. H., Sherwood, R. C., Davis, M. E., van Dover, R. B., Kammlott, G. W., Fastnacht, R. A., and Keith, H. D., Appl. Phys. Lett. 52, 2074 (1988)CrossRefGoogle Scholar
33.Salama, K., Selvamanickam, V., Gao, L., and Sun, K., Appl. Phys. Lett. 54, 2352 (1989).CrossRefGoogle Scholar
34.Yanagisawa, E., Kondoh, S., Shimoyama, J., Kase, J., Matsubara, T., and Morimoto, T., in High-Temperature Superconductors: Fundamental Properties and Novel Materials Processing, edited by Christen, D., Narayan, J., and Schneemeyer, L. (Mater. Res. Soc. Symp. Proc. 169, Pittsburgh, PA, 1990) p. 275.Google Scholar
35.Alford, N. McN., Birchall, J. D., Clegg, W. J., and Kendall, K., J. Appl. Phys. 65, 2856 (1989).CrossRefGoogle Scholar
36.Murakami, M., Morita, M., Doi, K., Miyamoto, K., and Hamada, H., Jpn. J. Appl. Phys. 28, 1189 (1989)CrossRefGoogle Scholar
37.Shi, D., Krishnan, H., Hong, J. M., Miller, D., McGinn, P. J., Chen, W. H., Xu, M., Chen, J. G., Fang, M. M., Welp, U., Lanagan, M. T., Goretta, K. C., Dusek, J. T., Picciolo, J. J., and Balachandran, U.J. Appl. Phys. 68, 228 (1990).CrossRefGoogle Scholar
38.Meng, R. L., Kinalidis, C., Sun, Y. Y., Gao, L., Tao, Y. K., Hor, P. H., and Chu, C. W., Nature 345, 326 (1990).CrossRefGoogle Scholar
39.Malozemoff, A. P., “Critical Current Density of High Temp. Superconductors,” to be published in Proc. TMS Symp. on High Tc Compounds, Anaheim, CA (1990).Google Scholar
40.Jin, S., Tiefel, T. H., Nakahara, S., Graebner, J. E., O'Bryan, H. M., Fastnacht, R. A., and Kammlott, G. W., Appl. Phys. Lett. 56, 1287 (1990).CrossRefGoogle Scholar
41. See Proceedings of Workshop on High Tc Superconductors, Univ. of Birmingham, U.K., reported in Cryogenics 28, 639 (1988).CrossRefGoogle Scholar
42.Askew, T. R. and Flippen, R. B., in High-Temperature Superconductors: Fundamental Properties and Novel Materials Processing, edited by Christen, D., Narayan, J., and Schneemeyer, L. (Mater. Res. Soc. Symp. Proc. 169, Pittsburgh, PA, 1990) p. 939.Google Scholar
43.Van Duzer, T. and Turner, C. W., Principles of Superconductive Devices and Circuits (Elsevier, New York, 1981), p. 152.Google Scholar
44.Evetts, J. E. and Glowacki, B. A., Cryogenics 28, 641 (1988).CrossRefGoogle Scholar
45.Willis, J. O., McHenry, M. E., Maley, M. P., and Sheinberg, H., IEEE Trans. Magn. 25, 2502 (1989).CrossRefGoogle Scholar
46.Hikata, T., Soto, K., and Hitotsuyanagi, H., Jpn. J. Appl. Phys. 28, L82 (1989).CrossRefGoogle Scholar
47.Kwasnitza, K., Plotzner, V., Waldmann, M., and Widmer, C., Proc. HTSC Conference, Interlaken, Switzerland, 1988, p. 1565.Google Scholar
48.Watanabe, K., Noto, K., Morita, H., Fujimori, H., Mizuno, K., Aomine, T., Ni, B., Matsushita, T., Yamafuji, K., and Muto, Y., Cryogenics 29, 263 (1989).CrossRefGoogle Scholar
49.Kwasnitza, K. and Widmer, C., Cryogenics 29, 1035 (1989), also Physica C 171, 211 (1990).CrossRefGoogle Scholar
50.Majoros, M., Polak, M., Strbik, V., Benacka, S., Chromik, S., Hanic, F., and Plechacek, V., Supercond. Sci. and Tech. 90, 227 (1990).CrossRefGoogle Scholar
51.Dai, U., Deutscher, G., Lacour, C., Laher-Lacour, F., Mocaer, P., and Langues, M., Appl. Phys. Lett. 56, 1284 (1990).CrossRefGoogle Scholar
52.Alford, N. McN., Birchall, J. D., Clegg, W. J., Harmer, M. A., Kendall, K., and Jones, D. H., J. Mater. Sci. 23, 761 (1988); see also Nature 332, 58 (1988).CrossRefGoogle Scholar
53.Goto, T. and Kada, M., J. Mater. Res. 3, 1292 (1988).CrossRefGoogle Scholar
54.Kimura, Y., Higuchi, N., Meguro, S., Takahashi, K., Uyeda, K., Ishihara, T., Inukai, E., and Umeda, M., IEEE Trans. Magn. 25, 2033 (1989).CrossRefGoogle Scholar
55.Leary, K. J., Jacobson, H. W., Levoy, N. F., Lapalomento, R. A., Askew, T. R., Flippen, R. B., Keller, S. W., and Stacy, A. M., J. Mater. Res. 5, 22 (1990).CrossRefGoogle Scholar
56.Leary, K. J., Jacobson, H. W., Askew, T. R., and Flippen, R. B., J. Am. Ceram. Soc. 73, 904 (1990).CrossRefGoogle Scholar
57.McGinnis, W. C., Jacobs, E. W., Rees, C. D., and Jones, T. E., Rev. Sci. Instrum. 61, 984 (1990).CrossRefGoogle Scholar
58.Askew, T. R., Flippen, R. B., and Swartz, E. T., Rev. Sci. Instrum. 61, 993 (1990).CrossRefGoogle Scholar
59.Lee, S. Y., Kim, Y. H., Park, J. H., and Choi, S. S., Appl. Phys. Lett. 56, 403 (1990).CrossRefGoogle Scholar
60.Qiu, X. G., Cui, C. G., Zhang, Y. Z., Li, S. L., Zhao, Y. Y., Xu, P., and Li, L., J. Appl. Phys. 68, 884 (1990).CrossRefGoogle Scholar
61.Krusin-Elbaum, L., Malozemoff, A. P., Yeshurun, Y., Cronemeyer, D. C., and Holtzberg, F., Phys. Rev. B 39, 2936 (1989).CrossRefGoogle Scholar
62.Ekin, J. W., Hart, H. R., and Gaddipati, A. R., J. Appl. Phys. 68, 2285 (1990).CrossRefGoogle Scholar
63.Ekin, J. W., Appl phys Lett 55, 905 (1989).Google Scholar
64.Kunchur, M. N. (unpublished manuscript)Google Scholar
65.Bean, C. P., Phys. Rev. Lett. 8, 250 (1962).CrossRefGoogle Scholar
66.Tinkham, M.; Introduction to Superconductivity (McGraw-Hill, Krieger, New York, 1985), pp. 173–175.Google Scholar