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Contrast Mechanism Maps for Piezoresponse Force Microscopy

Published online by Cambridge University Press:  31 January 2011

Sergei V. Kalinin  and
Dawn A. Bonnell
Sergei V. Kalinin
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia,Pennsylvania 19104
Dawn A. Bonnell
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut Street, Philadelphia,Pennsylvania 19104
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Extract

Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influence of experimental conditions such as tip radius of curvature, indentation force, and cantilever stiffness on PFM image contrast. These results are used to construct contrast mechanism maps, which correlate the imaging conditions with the dominant contrast mechanisms. Conditions under which materials properties can be determined quantitatively are elucidated.

Type
Rapid Communications
Information
Journal of Materials Research , Volume 17 , Issue 5 , May 2002 , pp. 936 - 939
Copyright
Copyright © Materials Research Society 2002

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