Book contents
- Measurement Techniques for Radio Frequency Nanoelectronics
- The Cambridge RF and Microwave Engineering Series
- Reviews
- Measurement Techniques for Radio Frequency Nanoelectronics
- Copyright page
- Contents
- Acknowledgments
- Abbreviations
- 1 An Introduction to Radio Frequency Nanoelectronics
- 2 Core Concepts of Microwave and RF Measurements
- 3 Extreme Impedance Measurements
- 4 On-Wafer Measurements of RF Nanoelectronic Devices
- 5 Modeling and Validation of RF Nanoelectronic Devices
- 6 Characterization of Nanofiber Devices
- 7 Instrumentation for Near-Field Scanning Microwave Microscopy
- 8 Probe-Based Measurement Systems
- 9 Radio Frequency Scanning Probe Measurements of Materials
- 10 Measurement of Active Nanoelectronic Devices
- 11 Dopant Profiling in Semiconductor Nanoelectronics
- 12 Depth Profiling
- 13 Dynamics of Nanoscale Magnetic Systems
- 14 Nanoscale Electromagnetic Measurements for Life Science Applications
- Index
- References
12 - Depth Profiling
Published online by Cambridge University Press: 21 September 2017
Book contents
- Measurement Techniques for Radio Frequency Nanoelectronics
- The Cambridge RF and Microwave Engineering Series
- Reviews
- Measurement Techniques for Radio Frequency Nanoelectronics
- Copyright page
- Contents
- Acknowledgments
- Abbreviations
- 1 An Introduction to Radio Frequency Nanoelectronics
- 2 Core Concepts of Microwave and RF Measurements
- 3 Extreme Impedance Measurements
- 4 On-Wafer Measurements of RF Nanoelectronic Devices
- 5 Modeling and Validation of RF Nanoelectronic Devices
- 6 Characterization of Nanofiber Devices
- 7 Instrumentation for Near-Field Scanning Microwave Microscopy
- 8 Probe-Based Measurement Systems
- 9 Radio Frequency Scanning Probe Measurements of Materials
- 10 Measurement of Active Nanoelectronic Devices
- 11 Dopant Profiling in Semiconductor Nanoelectronics
- 12 Depth Profiling
- 13 Dynamics of Nanoscale Magnetic Systems
- 14 Nanoscale Electromagnetic Measurements for Life Science Applications
- Index
- References
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- Measurement Techniques for Radio Frequency Nanoelectronics , pp. 203 - 221Publisher: Cambridge University PressPrint publication year: 2017
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