38 results
Traceable Measurements using a Metrology Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3088-3090
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- August 2022
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Getting your Scanning Electron Microscope to Perform at Atomic Resolution Levels
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1328-1329
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- August 2021
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Electron Irradiation Cleaning of the SEM and its Samples
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 434-435
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- August 2021
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Some Are More Equal Than Others: Intrasettlement Social Organization in Spišský Štvrtok (EBA/MBA, Slovakia)
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- Cambridge Archaeological Journal / Volume 31 / Issue 2 / May 2021
- Published online by Cambridge University Press:
- 06 November 2020, pp. 183-210
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- May 2021
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Measurand-Optimized, Content-Aware Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 244-245
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- August 2019
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Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry†
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- Microscopy and Microanalysis / Volume 23 / Issue 5 / October 2017
- Published online by Cambridge University Press:
- 18 September 2017, pp. 967-977
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- October 2017
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Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope†
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- Microscopy and Microanalysis / Volume 22 / Issue 4 / August 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 768-777
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- August 2016
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Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope - Part 2
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 608-609
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- July 2016
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Progression of Focused Helium Ion Beam Milling in Gold Substrates
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1979-1980
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- August 2015
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Comparison of Secondary, Backscattered and Low Loss Electron Imaging for Dimensional Measurements in the Scanning Electron Microscope
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1105-1106
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- August 2015
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Low-Loss Electron Imaging for Enhanced Surface Detail in the Scanning Electron Microscope: The Contributions of Oliver C. Wells
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- Microscopy Today / Volume 23 / Issue 1 / January 2015
- Published online by Cambridge University Press:
- 09 January 2015, pp. 24-27
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- January 2015
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Oliver C. Wells' Vision: Use of Low-Loss Electrons to Enhance and Measure the Surface Detail in the Scanning Electron Microscope at High Resolution
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 4-5
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- August 2014
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Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 336-337
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- August 2014
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Helium Ion Nanomachining in Membranes and Bulk Substrates
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 910-911
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- August 2013
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The game of active search for extra-terrestrial intelligence: breaking the ‘Great Silence’
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- International Journal of Astrobiology / Volume 12 / Issue 1 / January 2013
- Published online by Cambridge University Press:
- 06 November 2012, pp. 53-62
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Understanding Surface Modification of Silicon-based Materials using Gas Field Ion Source FIB for Nano-Machining Applications
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 830-831
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- July 2012
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Widening the Window of Particle Beam Technology: Helium Ion Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 802-803
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- July 2012
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A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 808-809
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- July 2012
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Three-Dimensional Measurements of Micro- to Nanometer-Scale Features at and Below the Surface Using Scanning Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 992-993
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- July 2011
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Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift
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- Microscopy and Microanalysis / Volume 17 / Issue 2 / April 2011
- Published online by Cambridge University Press:
- 02 December 2010, pp. 302-308
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- April 2011
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