Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract

Electron Tomography Study on Nanoscale HfOx/AlOy-based Resistive Switching Device

Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Electron Beam Critical Dimension Metrology Tool

Structural Switch of AlN Sputtered Thin Films From (101) to (002) Orientation, Driven by the Growth Kinetics

Finding unstrained 10 -nm lattice defects in silicon, given 1011 per cubic centimeter

Direct Observation of Oxygen Movement in Graphene Oxide-Based Resistive Switching Memory

Novel FIB-less Fabrication of Electrical Devices for in-situ Biasing

Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors

Temperature-dependent signals in STEM Electron Beam-Induced Current (EBIC) Imaging

High Contrast SEM Observation of Semiconductor Dopant Profile using TripleBeam® System

2D Junction Profiling on Semiconductor Device Reliability Fail

Radial Interference Contrast in in-situ SEM Observation of Metal Oxide Semiconductor Film Crystallization

Analysis of Amorphous-to-crystalline Germanium Stack with Cs-corrected Analytical STEM

Growth of ZnO thin films synthesized by chemical routes for optoelectronic applications

Assessing Hexagonal Boron Nitride Crystal Quality by Defect Sensitive Etching

Exploring the structural and electronic properties of nanowires at their mechanical limits

Mapping Anti-phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction

Transmission Electron Microscopy of Vertically Stacked ErAs-InAs Semimetal -Quantum Dot Nanocomposite Heterostructures Grown on GaAs(001) Substrates

Correlation of Etch Pits and Dislocations in As-grown and Thermal-Cycle-Annealed HgCdTe(211) Films

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract

Optical Spectroscopy at High Spatial Resolution with Fast Electrons

Mapping “Broken” Dark Modes Using Cathodoluminescence in a Scanning Electron Microscope

Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract

TEM/STEM/EELS/SNOM of Ultralow Energy Excitations

Abstract