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Optical Spectroscopy at High Spatial Resolution with Fast Electrons

Published online by Cambridge University Press:  04 August 2017

Luiz H. G. Tizei ,
Sophie Meuret ,
Noemie Bonnet ,
Francois Treussart ,
Bruno Daudin ,
Bruno Gayral ,
Romain Brourellier ,
Anna Tararan ,
Alberto Zobelli  and
Yung-Chang Lin
...Show all authors
Luiz H. G. Tizei
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France
Sophie Meuret
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France
Noemie Bonnet
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France
Francois Treussart
Affiliation:
Laboratoire Aime Cotton, CNRS, Universite Paris Sud and ENS Paris-Saclay, Orsay, France
Bruno Daudin
Affiliation:
CEA, INAC-PHELIQS, « Nanophysique est semiconducteurs group », Grenoble, France
Bruno Gayral
Affiliation:
CEA, INAC-PHELIQS, « Nanophysique est semiconducteurs group », Grenoble, France
Romain Brourellier
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France
Anna Tararan
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France
Alberto Zobelli
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France
Yung-Chang Lin
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
Kazu Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
Luiz. F. Zagonel
Affiliation:
Instituto de Fiisica "Gleb Wataghin" Universidade Estadual de Campinas - Unicamp, Campinas, Sao Paulo, Brazil
Odile Stephan
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France
Mathieu Kociak
Affiliation:
Laboratoire de Physique des Solides, UMR 8502 CNRS and Universite Paris-Sud, Orsay, France

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1528 - 1529
Copyright
© Microscopy Society of America 2017 

References

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