Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 11
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 11 - October 2005

Contents

Page 18 of 61

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age

Research Article

  • Beam Blanking Studies in Environmental Scanning Electron Microscopy

  • H Dobberstein, N J Purser, T W Fairhead, D J Stokes, R W Knowles
  • Published online by Cambridge University Press:
    01 August 2005, pp. 400-401
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Improve X-ray Microanalysis in Variable-Pressure SEMs with Polycapillary X-ray Optics

  • N Gao, B Gallagher, D Ackland, D E Newbury
  • Published online by Cambridge University Press:
    01 August 2005, pp. 402-403
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Precision Signal Amplifier for Improved Imaging of Insulating Samples using Variable Pressure SEM

  • W R Knowles, M Kliment, R Schroemges
  • Published online by Cambridge University Press:
    01 August 2005, pp. 404-405
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Skirt Corrections in the Variable Pressure SEM Related to Rutherford Cross-Sections

  • K Robertson, R Gauvin, J Finch
  • Published online by Cambridge University Press:
    01 August 2005, pp. 406-407
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Calculating an EDS Spectrum without Scatter in LV Mode

  • R Anderhalt, L M Swenson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 408-409
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Charging: a Limitation to Perform X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope

  • J-F Le Berre, R Gauvin, G P Demopoulos
  • Published online by Cambridge University Press:
    01 August 2005, pp. 410-411
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • ESEM - the Ultimate in-situ Observation Tool at High and Low Temperatures

  • M Schmied, H Schroettner, J Wagner
  • Published online by Cambridge University Press:
    01 August 2005, pp. 412-413
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Development of Low Temperature ESEM: Exploring Sublimation

  • D Waller, D J Stokes, A M Donald
  • Published online by Cambridge University Press:
    01 August 2005, pp. 414-415
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Combined ESEM and CT Scan: The Process of Salt Weathering

  • E Doehne, D Carson, A Pasini
  • Published online by Cambridge University Press:
    01 August 2005, pp. 416-417
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • WETSEMtm - A New Technology for High Resolution Imaging of Fully Hydrated Biological Samples

  • A Nechushtan, A Vainshtein, M Horowitz, A Sabban, O Zik
  • Published online by Cambridge University Press:
    01 August 2005, pp. 418-419
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Optimization of a Method for Imaging Drosophila Embryos with a Variable Pressure Scanning Electron Microscope

  • M Gignac, X Chen, S Lockett, K Nagashima
  • Published online by Cambridge University Press:
    01 August 2005, pp. 420-421
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • ESEM Characterization of Grafoil Flow Field Plates

  • F P Orfino
  • Published online by Cambridge University Press:
    01 August 2005, pp. 422-423
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microanalysis of Nb3Sn Superconducting Wire Using the Environmental Electron Microscope

  • R Goddard, J Chen, E McClellan, K Han
  • Published online by Cambridge University Press:
    01 August 2005, pp. 424-425
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Spectral Imaging: Advances and Applications

Research Article

  • Multivariate Analysis of X-ray, Ion and Electron Spectral Images: From Surface to 3D Materials Characterization

  • P G Kotula, M R Keenan
  • Published online by Cambridge University Press:
    01 August 2005, pp. 426-427
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Mapping 3D X-ray Fluorescence Datasets to Elemental Distributions using Principal Component Analysis and Fitting

  • S Vogt, C Jacobsen, A LeFurgey, D Kopf, B Lai, P Ingram, J Maser
  • Published online by Cambridge University Press:
    01 August 2005, pp. 430-431
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of Cl-Implanted Al Films with STEM-EDS Spectral Imaging

  • D Elswick, J J Hren, P G Kotula, N A Missert
  • Published online by Cambridge University Press:
    01 August 2005, pp. 432-433
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • An Automated Hybrid Clustering Technique Applied to Spectral Data Sets

  • N C Wilson, C M MacRae
  • Published online by Cambridge University Press:
    01 August 2005, pp. 434-435
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Cathodoluminescence and Energy Dispersive X-ray Spectral Data Sets - Processing the Data

  • C M MacRae, N C Wilson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 436-437
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Spectrum Imaging Techniques Applied to Forensics Investigations

  • L N Brewer, P G Kotula, J A Ohlhausen, J R Michael
  • Published online by Cambridge University Press:
    01 August 2005, pp. 438-439
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 18 of 61