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Volume 11 - October 2005

Contents

Page 15 of 61

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM

Research Article

  • Mapping the Cellular Proteome by Cryoelectron Microscopy

  • S I Nickell, I Nagy, C Kofler, W Baumeister
  • Published online by Cambridge University Press:
    01 August 2005, pp. 282-283
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Automated 3D Imaging at Ambient and Cryogenic Conditions

  • W M Busing, F de Haas, U Lucken, L Melanson, W M A Hax, M M H Storms
  • Published online by Cambridge University Press:
    01 August 2005, pp. 284-285
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Efficient Strategy for Processing Single Particle Data from a Cryo-EM Exposure Series

  • R A Grassucci, W T Baxter, E S Barnard, J Frank
  • Published online by Cambridge University Press:
    01 August 2005, pp. 286-287
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Programmable TEM Image Collection System

  • N Nakamura, T Moriya, T Shinkawa, C R Booth, W Chiu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 288-289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Pneumatic Micro-Sprayer for Millisecond Time Resolution in Cryo-Electron Microscopy

  • D Barnard, T Wagenknecht
  • Published online by Cambridge University Press:
    01 August 2005, pp. 290-291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of an Acid Mine Biofilm by Cryo Scanning Electron Microscopy

  • G Vrdoljak, S Spiller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 292-293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Environment Monitoring for Transmission Electron Microscopy

  • D Fellmann, R Banez, B Carragher, C Potter
  • Published online by Cambridge University Press:
    01 August 2005, pp. 294-295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Tomography in Biological and Materials Sciences

Research Article

  • Quantitative Measurement of Local Shear Strain in Nano-scale using 3D-ET

  • K Kaneko, K Inoke, M Weyland, P A Midgley, Z Horita
  • Published online by Cambridge University Press:
    01 August 2005, pp. 296-297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Advantage of Zero-Loss Imaging in Transmission Electron Microtomography

  • Y Nishikawa, H Nishioka, T Kaneko, T Nishi, H Jinnai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 298-299
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Phase Contrast HRTEM and DF-STEM Electron Tomography Reconstructions of Polymer/Layered Silicate Nanocomposites

  • L F Drummy, H Koerner, Y C Wang, K Anderson, B L Farmer, R Vaia
  • Published online by Cambridge University Press:
    01 August 2005, pp. 300-301
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Classification of Artifacts in 3D-TEM Tomography of FePt-MgO Crystalline Samples Studied by Multislice Image Simulation

  • N Tanaka, A Ohno, J Yamasaki
  • Published online by Cambridge University Press:
    01 August 2005, pp. 302-303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Automated Cryo-ET: State of the Art and Future Perspectives

  • J M Plitzko, S Nickell, G Schweikert, F Beck, W Baumeister
  • Published online by Cambridge University Press:
    01 August 2005, pp. 306-307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Mr T.: Automated Electron Cryotomography for JEOL 2010F TEM

  • J T Chang, M Marsh, F Rixon, W Chiu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 308-309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Use of the Zernike Phase Plate for Electron Tomography of Frozen-Hydrated Specimens

  • M Marko, C Hsieh, K Dunn, D Typke, C Mannella, J Frank
  • Published online by Cambridge University Press:
    01 August 2005, pp. 310-311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Resolution, High Throughput Electron Tomography Reconstruction

  • R H M Schoenmakers, R A Perquin, T F Fliervoet, W Voorhout
  • Published online by Cambridge University Press:
    01 August 2005, pp. 312-313
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction

  • M A O’Keefe, K H Downing, H-R Wenk, H Meisheng
  • Published online by Cambridge University Press:
    01 August 2005, pp. 314-315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Theory of Phase Reconstructed Vector Field Electron Tomography

  • M De Graef, M Beleggia
  • Published online by Cambridge University Press:
    01 August 2005, pp. 316-317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Tomographic Imaging with Single Atom Sensitivity Using Aberration-Corrected STEM

  • K van Benthem, A R Lupini, Y Peng, S J Pennycook
  • Published online by Cambridge University Press:
    01 August 2005, pp. 318-319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 15 of 61