Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 11
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 11 - October 2005

Contents

Page 19 of 61

Spectral Imaging: Advances and Applications

Research Article

  • Tomographic Spectral Imaging: Analysis of Localized Corrosion

  • P G Kotula, M R Keenan, J R Michael
  • Published online by Cambridge University Press:
    01 August 2005, pp. 440-441
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Imaging Analytical Studies of Lead Soaps Aggregating in Preprimed Canvas Used by the Hudson River Painter F.E. Church

  • J Boon, K Keune, J Zucker
  • Published online by Cambridge University Press:
    01 August 2005, pp. 444-445
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • SEM and Elemental Analysis of Phosphorus Concentrations Cullen Soil Amended with Biosolids Under Rainfall Simulation

  • E W Westbrook, C J Bronick, A Atalay
  • Published online by Cambridge University Press:
    01 August 2005, pp. 446-447
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advanced Detectors

Research Article

  • Microcalorimeter Detectors for Next-Generation X-ray Spectrometers

  • R Cantor
  • Published online by Cambridge University Press:
    01 August 2005, pp. 452-453
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Large Area Silicon Drift Detectors for EDS in Microbeam Analysis

  • H Soltau, P Lechner, G Lutz, A Niculae, L Strüder, C Fiorini, A Longoni, R Eckhard, G Schaller, F Schopper
  • Published online by Cambridge University Press:
    01 August 2005, pp. 456-457
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Advances in Technology and Application of Silicon Drift Detectors

  • T Schülein, R Terborg, M Rohde
  • Published online by Cambridge University Press:
    01 August 2005, pp. 460-461
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Life with a Microcalorimeter EDS Detector on a FEG-SEM

  • E A Kenik, H Demers
  • Published online by Cambridge University Press:
    01 August 2005, pp. 462-463
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Deconvolution of Closely Spaced Spectral Features with a Microcalorimeter EDS

  • H Demers, R Gauvin, I M Anderson, D C Joy, E A Kenik
  • Published online by Cambridge University Press:
    01 August 2005, pp. 464-465
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • X-Ray Mapping Using Multiple-EDS and WDS Detectors

  • R Wuhrer, K Moran, M R Phillips, P Davey
  • Published online by Cambridge University Press:
    01 August 2005, pp. 466-467
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Parallel Beam Wavelength X-Ray Spectroscopy: An Evaluation of Current Performance

  • D Redfern, A Sandborg
  • Published online by Cambridge University Press:
    01 August 2005, pp. 468-469
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Direct Detectors of Electrons for STEM and TEM

  • P Rehak, J S Wall, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 470-471
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Quantitative Study of the Transition Layers in Mo/Si; Multilayers from the Analysis of the Si KΒ X–ray Emission Band

  • H Maury, J–M André, P Jonnard
  • Published online by Cambridge University Press:
    01 August 2005, pp. 472-473
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Improved ATR Infrared Microanalysis of Thin Multilayered Samples and Included Small Particles

  • T J Tague Jr, G Hall
  • Published online by Cambridge University Press:
    01 August 2005, pp. 474-475
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Ultrafast Electron Diffraction and Microscopy

Research Article

  • Ultrafast Electron Microscopy in Materials Science

  • W E King, M Armstrong, G Campbell, A Frank, B Reed, B Stuart
  • Published online by Cambridge University Press:
    01 August 2005, pp. 476-477
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Femtosecond Electron Diffraction: Probe and Control of Ultrafast Structural Dynamics

  • H Park, S Nie, X Wang, J Cao
  • Published online by Cambridge University Press:
    01 August 2005, pp. 478-479
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 19 of 61