Hostname: page-component-77c89778f8-rkxrd Total loading time: 0 Render date: 2024-07-16T15:50:30.614Z Has data issue: false hasContentIssue false
  • English
  • Français

Direct Detectors of Electrons for STEM and TEM

Published online by Cambridge University Press:  01 August 2005

P Rehak ,
J S Wall  and
Y Zhu
P Rehak
Affiliation:
Brookhaven National Laboratory, Upton, New York
J S Wall
Affiliation:
Brookhaven National Laboratory, Upton, New York
Y Zhu
Affiliation:
Brookhaven National Laboratory, Upton, New York

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 470 - 471
Copyright
© 2005 Microscopy Society of America