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Volume 11 - October 2005

Contents

Page 20 of 61

Ultrafast Electron Diffraction and Microscopy

Research Article

  • A Monochromatic Laser-pulsed Picosecond Electron Field-emitter

  • J C H Spence, T Vecchione, U Weierstall, G Hembree
  • Published online by Cambridge University Press:
    01 August 2005, pp. 480-481
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Quality Electron Beams from Laser Wakefield Acceleration: A New Compact Source for Electron Microscopes?

  • J Mansfield, J Nees, G Mourou, A Galvanauskas
  • Published online by Cambridge University Press:
    01 August 2005, pp. 482-483
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Development of a Dynamic Transmission Electron Microscope (DTEM) for the Study of Self-Propagating Reactions in Multilayer Foils

  • J Kang, A Ziegler, N Browning, G Campbell
  • Published online by Cambridge University Press:
    01 August 2005, pp. 484-485
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advances in Energy-Filtered Transmission Electron Microscopy

Research Article

  • EFTEM of Nanoprecipitates: Where Are the Limits?

  • S Lozano-Perez, M L Jenkins, J M Titchmarsh
  • Published online by Cambridge University Press:
    01 August 2005, pp. 486-487
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Effect of Cs-Correction on Filtered Imaging and Spectral Energy Resolution for a Post-Column Imaging Energy Filter

  • M M G Barfels, M Kundmann, C Trevor, J A Hunt
  • Published online by Cambridge University Press:
    01 August 2005, pp. 488-489
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Optimizing & Automating EELS/EFTEM Parameters using Spectrum Simulation

  • J A Hunt, N K Menon
  • Published online by Cambridge University Press:
    01 August 2005, pp. 490-491
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Characterization of 6H-SiC/SiO2 Interfaces by EFTEM Elemental Mapping

  • J Bentley, K-C Chang, L M Porter
  • Published online by Cambridge University Press:
    01 August 2005, pp. 494-495
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • EFTEM and EELS Studies of the Interface Structure of Ni/MgO

  • K Sun, L M Wang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 496-497
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Elemental Mapping of NiTi with EFTEM

  • J E Wittig, J Bentley, N D Evans, C Somsen, G Eggeler
  • Published online by Cambridge University Press:
    01 August 2005, pp. 498-499
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Synthesis and Characterization of Doped ZnO Photocatalysts

  • A C Dodd, A J McKinley, M Saunders, T Tsuzuki
  • Published online by Cambridge University Press:
    01 August 2005, pp. 500-501
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Characterizing the Limits of EBSD Analysis

Research Article

  • EBSD — Probably The Best Measurement In The World??

  • A P Day
  • Published online by Cambridge University Press:
    01 August 2005, pp. 502-503
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • EBSD Sample Preparation: Techniques, Tips, and Tricks

  • M M Nowell, R A Witt, B True
  • Published online by Cambridge University Press:
    01 August 2005, pp. 504-505
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Automated Three-dimensional EBSD Analysis of Materials

  • J J L Mulders, H L Fraser
  • Published online by Cambridge University Press:
    01 August 2005, pp. 506-507
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Grain Boundary Studies in CuInGaSe2 Using EBSD in the Dual Beam FIB

  • B P Gorman, M J Kaufman, M M Nowell, S Yoon, T Anderson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 508-509
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Pseudosymmetry in EBSD Patterns

  • M D Vaudin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 510-511
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Multivariate Statistical Approaches for Electron Backscattered Diffraction

  • L N Brewer, P G Kotula, J R Michael
  • Published online by Cambridge University Press:
    01 August 2005, pp. 512-513
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Orientation Dependence of EBSD Pattern Quality

  • S R Claves, A Deal
  • Published online by Cambridge University Press:
    01 August 2005, pp. 514-515
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Applications of EBSD to the Study of Localized Deformation

  • R H Geiss, D T Read, A Roshko, K A Bertness, R R Keller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 516-517
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Challenges in EBSD Investigations of Microstructures Formed During Plastic Deformation

  • A Godfrey
  • Published online by Cambridge University Press:
    01 August 2005, pp. 518-519
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Elastic Strain Tensor Mapping - Extending the Limits of EBSD Analysis

  • A J Wilkinson, G Meaden, D J Dingley
  • Published online by Cambridge University Press:
    01 August 2005, pp. 520-521
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 20 of 61