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Volume 11 - October 2005

Contents

Page 23 of 61

Theory and Applications of Focal-Series Reconstruction in HRTEM

Research Article

  • Theory and Applications of Focal-Series Reconstruction in HRTEM

  • A Thust
  • Published online by Cambridge University Press:
    01 August 2005, pp. 602-603
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Digital Imaging

Research Article

  • An Historical Perspective on Digital Imaging in Transmission Electron Microscopy: Looking to the Future

  • M H Ellisman
  • Published online by Cambridge University Press:
    01 August 2005, pp. 604-605
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Digital Imaging Workflow for TEM Using a Low Cost Scanner

  • J Mackenzie Jr.
  • Published online by Cambridge University Press:
    01 August 2005, pp. 606-607
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Performance Characterization and Improvement for CCD Cameras in Transmission Electron Microscopy

  • K H Downing
  • Published online by Cambridge University Press:
    01 August 2005, pp. 608-609
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A New Type of Detector for Electron Microscopy

  • N H Xuong, A C Milazzo, S Peltier, P Leblanc, F Duttweiler, L Jin, J C Bouwer, S Peltier, M Ellisman, S Kleinfelder
  • Published online by Cambridge University Press:
    01 August 2005, pp. 612-613
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Measures to Reduce X-ray Noise in a CCD High Quality Image Camera for HVEM

  • K Yoshida, T Furutsu, S Shimojo, H Mori
  • Published online by Cambridge University Press:
    01 August 2005, pp. 614-615
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Automated TEM Data Acquisition Applications Using Robotic Grid Loading

  • C Suloway, B Carragher, J Pulokas, C S Potter
  • Published online by Cambridge University Press:
    01 August 2005, pp. 616-617
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Throughput Image Acquisition Using the Leginon System

  • J Pulokas, C Suloway, D Fellmann, Y Zhu, A Cheng, J Quispe, F Guerra, S Stagg, C S Potter, B Carragher
  • Published online by Cambridge University Press:
    01 August 2005, pp. 618-619
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Improved Electron Microscopy with Monte Carlo Simulations

Research Article

  • Improved Electron Microscopy with Monte Carlo Simulations

  • R Gauvin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 620-621
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Recent Progress in 3D Microscopy Imaging

Research Article

  • Transmission Electron Microtomography (TEMT) of Nanostructured Polymers and Polymer Nanocomposites

  • R J Spontak, A O Gozen, M B Braunfeld, D A Agard
  • Published online by Cambridge University Press:
    01 August 2005, pp. 622-623
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Survey of Electron Microscopic Methods for 3-D Imaging

  • M Marko
  • Published online by Cambridge University Press:
    01 August 2005, pp. 624-625
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Recent Progress in Dual-Beam Microscopy 3D Imaging

  • Z G Li
  • Published online by Cambridge University Press:
    01 August 2005, pp. 626-627
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Three-dimensional Nanoanalysis with the Local Electrode Atom Probe

  • M K Miller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 628-629
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 3D Composition Imaging Using a Dedicated FIB/STEM System

  • T Yaguchi, M Konno, T Kamino, K Kaji, T Ohnishi, M Watanabe
  • Published online by Cambridge University Press:
    01 August 2005, pp. 630-631
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 3-D Image Analysis of Multiphase Materials using Laser Scanning Confocal Microscopy

  • A M Elwazri, P Wanjara, M Brochu, S Yue
  • Published online by Cambridge University Press:
    01 August 2005, pp. 634-635
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Computer Vision Algorithms for 3D Reconstruction of Microscopic Data-A Review

  • C Kammerud, B Abidi, M Abidi
  • Published online by Cambridge University Press:
    01 August 2005, pp. 636-637
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • 3D Imaging by Laser Scanning Confocal Microscopy

  • L Liang, K Czymmek
  • Published online by Cambridge University Press:
    01 August 2005, pp. 638-639
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Whole Mouse Brain: The Spatial Distribution and Morphology of Its Neurons

  • B H McCormick, D M Mayerich, B L Busse, Z Melek, W Koh, L C Abbott, Y Choe, J Keyser, E-J Kim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 640-641
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 23 of 61