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Volume 11 - October 2005

Contents

Page 26 of 61

Advances in Instrumentation and Technique

Research Article

  • Development of a Noble Field Emitter Using Self-Aligned Carbon Nanotubes

  • K Tatsumi, T Tanji, M Kusunoki
  • Published online by Cambridge University Press:
    01 August 2005, pp. 724-725
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Confocal Scanning Optical Microscope System for Measuring Refractive Index Profiles of Specialty Optical Waveguides

  • Y Youk, D Y Kim
  • Published online by Cambridge University Press:
    01 August 2005, pp. 726-727
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Limits of Spatial Resolution of a Raman Microscope

  • F Adar, S Mamedov, A Whitely
  • Published online by Cambridge University Press:
    01 August 2005, pp. 728-729
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Advances in Energy-Filtered Transmission Electron Microscopy

Research Article

  • The Use of EELS to Study the Urbach Edge of Silica

  • S C Cheng, S L Schiefelbein, L Moore, M Pierson-Stull, S Sen, C Smith
  • Published online by Cambridge University Press:
    01 August 2005, pp. 730-731
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Structure of Low-Loss EELS in Rhenium

  • R W Carpenter, A V G Chizmeshya
  • Published online by Cambridge University Press:
    01 August 2005, pp. 734-735
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • In situ Transmission Electron Energy Loss Spectroscopy of E-beam Modifications in Oxide Glasses and Crystals

  • N Jiang
  • Published online by Cambridge University Press:
    01 August 2005, pp. 736-737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • High Resolution EELS Investigation Of Hexagonal Transition Metal Perovskites

  • C Maunders, H Whitfield, G Radtke, G A Botton, S Lazar, J Etheridge
  • Published online by Cambridge University Press:
    01 August 2005, pp. 738-739
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Refinements in the Collection of Energy Filtered Diffraction Patterns from Disordered Materials

  • D G McCulloch, T C Petersen, W McBride, D Lau, C How Ho Fat, I K Snook, I Yarovsky
  • Published online by Cambridge University Press:
    01 August 2005, pp. 740-741
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Valence State Mapping of Iron Oxide Thin Film by Signal Processed ESI Series Energy-Loss Image

  • K-F Chen, F-R Chen, J-J Kai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 742-743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Scanning Electron Microscopy (SEM)

Research Article

  • Imaging of Non-conductors by Ultra-high Resolution Immersion Lens SEM

  • M Toth, B Thiel, R Knowles
  • Published online by Cambridge University Press:
    01 August 2005, pp. 744-745
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Simultaneous Observations of Different Type Images in a Scanning Electron Microscope

  • A Yamada, T Negishi, M Yamada, Y Tokiwa, H Ohashi, H Kazumori
  • Published online by Cambridge University Press:
    01 August 2005, pp. 746-747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Study of Beam Sensitive Materials Using High Resolution, ULV Scanning Electron Microscopy

  • M Nakagawa, S Takeuchi, A Muto, T Ogashiwa, S White, M Sato
  • Published online by Cambridge University Press:
    01 August 2005, pp. 748-749
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Wide Range Image-shift Functions in SEM for Probing Applications

  • T Agemura, M Sato, T Mizuno, H Yanagita, F Yano
  • Published online by Cambridge University Press:
    01 August 2005, pp. 750-751
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • X-Ray Microanalysis of Fully Wet Samples Using WETSEMtm Technology

  • I Ruach-Nir
  • Published online by Cambridge University Press:
    01 August 2005, pp. 754-755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Role of Sample Collection and Scanning Electron Microscopy (SEM) in Contaminant Analysis in Hospital Pharmacies

  • F Melnick, H Bhattacharjee, R J Lee
  • Published online by Cambridge University Press:
    01 August 2005, pp. 756-757
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Technologies to Characterize Nanostructured Particles and Bulk Materials

  • H Jaksch, M Steigerwald, V Drexel
  • Published online by Cambridge University Press:
    01 August 2005, pp. 758-759
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 26 of 61