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Volume 11 - October 2005

Contents

Page 29 of 61

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences

Research Article

  • Dual Beam Approach to Nano-Scale Defect Correction of High-End Photolithographic Masks

  • J G Marshman, A A Graupera, M A Coy
  • Published online by Cambridge University Press:
    01 August 2005, pp. 844-845
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Advanced Characterization Methods for Solid Oxide Fuel Cell Materials

  • L A Le Tarte, J R Cournoyer, K Dovidenko, E J Olson, J A Ruud, T Striker
  • Published online by Cambridge University Press:
    01 August 2005, pp. 846-847
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Total Release Method for FIB In-situ TEM Sample Preparation

  • L Zaykova-Feldman, T M Moore
  • Published online by Cambridge University Press:
    01 August 2005, pp. 848-849
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Growth Mechanisms of Electron Beam Induced Carbon Deposition Using Hydrocarbon Contamination

  • A D Garetto, D D Griffis, P E Russell, P D Rack, J Fowlkes
  • Published online by Cambridge University Press:
    01 August 2005, pp. 850-851
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • FIB Preparation and STEM Observation of Specified Area from Two Direction

  • T Kuba, N Endo, E Okunishi, T Suzuki
  • Published online by Cambridge University Press:
    01 August 2005, pp. 852-853
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Cryo-FIB for Thinning Cryo-TEM samples and Evading Ice During Cryo-Transfer

  • W J MoberlyChan, M Marko, C-E Hsieh
  • Published online by Cambridge University Press:
    01 August 2005, pp. 854-855
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Site-specific Automated 3D Imaging of Cells and Tissues Using a Dual-Beam Microscope

  • J Heymann, M Hayles, I Gestman, D Shi, B Lich, S Subramaniam
  • Published online by Cambridge University Press:
    01 August 2005, pp. 858-859
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Presidential Symposium: The Golden Anniversary of Imaging Atoms

Research Article

  • How the World First Saw Atoms: An Outline of How Field Ion Imaging Works

  • R G Forbes
  • Published online by Cambridge University Press:
    01 August 2005, pp. 860-861
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The State and Future Directions of Atom Probe Tomography

  • M K Miller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 862-863
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • A Review of Field Electron Source Use in Electron Microscopes

  • L W Swanson, G A Schwind
  • Published online by Cambridge University Press:
    01 August 2005, pp. 864-865
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Microfabricated Field Emitter Arrays

  • C A Spindt
  • Published online by Cambridge University Press:
    01 August 2005, pp. 866-867
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Evolution of Scanned Probe Microscopy: Two Decades of Rapidly Evolving Techniques and Applications

  • P E Russell, M E Salmon
  • Published online by Cambridge University Press:
    01 August 2005, pp. 868-869
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Metallic nanostructures characterized by three-dimensional atom probe

  • K Hono
  • Published online by Cambridge University Press:
    01 August 2005, pp. 870-871
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nanonstructural Analysis of Advanced Alloys in a Local Electrode Atom Probe

  • D W Saxey, J Hanna, R K Zheng, R K Marceau, I Baker, S P Ringer
  • Published online by Cambridge University Press:
    01 August 2005, pp. 872-873
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Creating Polymer Microtip Specimens for Atom Probe Tomography

  • S L P Kostrna, T J Mengelt, M Ali, D J Larson, T F Kelly, S L Goodman
  • Published online by Cambridge University Press:
    01 August 2005, pp. 874-875
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Atomic Observations of Warm Rolled Low Carbon Steels Alloyed with Cr and P

  • E V Pereloma, M K Miller
  • Published online by Cambridge University Press:
    01 August 2005, pp. 876-877
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Specimen Temperature Rises in a Nanosecond Laser Pulsed 3-D Atom Probe

  • A Cerezo, P H Clifton, G D W Smith
  • Published online by Cambridge University Press:
    01 August 2005, pp. 878-879
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Influence of Time-of-Flight (TOF) Mass Spectra Peak Resolution on Elemental Detection Limits for Atom Probe Instrumentation

  • P H Clifton, A Cerezo, G N F Chapman
  • Published online by Cambridge University Press:
    01 August 2005, pp. 880-881
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Pre-sharpened and Flat-top Microtip Coupons: a Quantitative Comparison for Atom-Probe Analysis Studies

  • K Thompson, D J Larson, R M Ulfig
  • Published online by Cambridge University Press:
    01 August 2005, pp. 882-883
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 29 of 61