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Volume 11 - October 2005

Contents

Page 22 of 61

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley

Research Article

  • Measuring Local Thickness Through Small-Tilt Fringe Visibility

  • E Mandell, P Fraundorf, W Qin
  • Published online by Cambridge University Press:
    01 August 2005, pp. 562-563
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Holography with Variable Magnification for Semiconductor Device Characterization

  • Y-Y Wang, A Domenicucci, M Kawasaki, J Bruley, M Gribelyuk, J Gaudiello
  • Published online by Cambridge University Press:
    01 August 2005, pp. 564-565
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Characterization of Bulk Plasmons and Bulk Phonons Using Energy-filtered Diffracted Beam Holography and Energy-filtered Kossel-imaging Holography

  • R A Herring
  • Published online by Cambridge University Press:
    01 August 2005, pp. 566-567
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Evaluation of Electric Potential Distribution near FEG-Emitter by Electron Holography

  • T Oikawa, T Tomita, H S Park, D Shindo
  • Published online by Cambridge University Press:
    01 August 2005, pp. 568-569
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Holography and Imaging Capabilities of the JEOL 2100F-LM

  • M A Schofield, M Beleggia, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 570-571
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • The Side-Effects of a Non-Mechanical Shutter in the Gun Area of a Transmission Electron Microscope for Off-Axis Electron Holography

  • E Voelkl, L F Allard, B G Frost, M D Anderson
  • Published online by Cambridge University Press:
    01 August 2005, pp. 572-573
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Strain Mapping of Interfaces by Quantitative High-Resolution TEM

  • C L Johnson, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 574-575
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Interfaces in Next Generation Ta and NbO Solid Electrolytic Capacitors

  • M Olszta, J Sloppy, J Wang, E C Dickey
  • Published online by Cambridge University Press:
    01 August 2005, pp. 578-579
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Structural Characterization of Nano-Oxide Layers in PtMn Based Specular Spin Valve Thin Films

  • L Chen
  • Published online by Cambridge University Press:
    01 August 2005, pp. 580-581
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Magnetization Reversal of Modified Circular Nanoscale Ferromagnetic Elements

  • H Hu, H Wang, M R McCartney, D J Smith
  • Published online by Cambridge University Press:
    01 August 2005, pp. 582-583
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Electron Holographic Observation of a Micro-Magnetic Field Current Generated from a Helical Carbon Coil

  • K Yamamoto, T Hirayama, M Kusunoki, S Yang, S Motojima
  • Published online by Cambridge University Press:
    01 August 2005, pp. 584-585
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Mean Inner Potentials in Oxidized Germanium Nanowires by Electron Holography

  • J Chung, J-P Zhou, L Rabenberg
  • Published online by Cambridge University Press:
    01 August 2005, pp. 588-589
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • An Alternative Explanation for Diffractive Imaging Technique

  • X Tao, J Wall, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 590-591
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Using Iteration Algorithm to Solve the Twin Image Problem for Shadow Imaging

  • X Tao, J Wall, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2005, pp. 592-593
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Coherent Scattering in the STEM

  • J S Wall
  • Published online by Cambridge University Press:
    01 August 2005, pp. 594-595
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Mapping of Two Dimensional Doping Areas in CMOS Device by Using Transport of Intensity Equation

  • W-K Hsieh, F-R Chen, Y-M Chen, H-W Hsu, J-J Kai
  • Published online by Cambridge University Press:
    01 August 2005, pp. 596-597
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Nanofabrication and Growth Processes with Ultra-High Resolution Electron Beam Induced Deposition on Thin Films

  • W F van Dorp, P A Crozier, C W Hagen, P Kruit
  • Published online by Cambridge University Press:
    01 August 2005, pp. 598-599
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

  • Calculations of HREM Image Intensity Using Monte Carlo Integration

  • L Y Chang, R R Meyer, A I Kirkland
  • Published online by Cambridge University Press:
    01 August 2005, pp. 600-601
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 22 of 61