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Evaluation of Electric Potential Distribution near FEG-Emitter by Electron Holography

Published online by Cambridge University Press:  01 August 2005

T Oikawa ,
T Tomita ,
H S Park  and
D Shindo
T Oikawa
Affiliation:
University of Sydney, Australia
T Tomita
Affiliation:
JEOL Ltd., Tokyo, Japan
H S Park
Affiliation:
Tohoku University, Sendai, Japan
D Shindo
Affiliation:
Tohoku University, Sendai, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 568 - 569
Copyright
© 2005 Microscopy Society of America