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Charging: a Limitation to Perform X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2005

J-F Le Berre ,
R Gauvin  and
G P Demopoulos
J-F Le Berre
Affiliation:
McGill University,Canada
R Gauvin
Affiliation:
McGill University,Canada
G P Demopoulos
Affiliation:
McGill University,Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 410 - 411
Copyright
© 2005 Microscopy Society of America