Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 12
Alternatives to Image Quality (IQ) Mapping in EBSD
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- Published online by Cambridge University Press:
- 01 August 2002, pp. 692-693
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- Cited by 12
Focused Ion Beam (FIB) Milling Damage Formed During Tem Sample Preparation of Silicon
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 656-657
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- Cited by 12
Atomic-Resolution STEM in the Aberration-Corrected JEOL JEM2200FS
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- 03 January 2008, pp. 104-112
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- Cited by 12
3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 362-363
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- Cited by 12
Advances in STEM-CELL. A Free Software for TEM and STEM Analysis and Simulations: Probe Deconvolution in STEM-HAADF
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 1292-1293
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- Cited by 12
Three-Dimensional Nanoscale Characterization of Pt Deposition from an Organometallic Precursor Induced by a Focused Ion Beam
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- Published online by Cambridge University Press:
- 31 July 2006, pp. 1252-1253
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- Cited by 12
Visualization of Bacterial Colonization and Cellular Layers in a Gut-on-a-Chip System Using Optical Coherence Tomography
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- 27 October 2020, pp. 1211-1219
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- Cited by 12
Transmission Electron Microscopy Specimen Preparation Method for Multiphase Porous Functional Ceramics
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- 13 February 2013, pp. 501-505
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- Cited by 12
Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM
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- 27 August 2014, pp. 684-685
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- Cited by 12
The Composition of Poly(Ethylene Terephthalate) (PET) Surface Precipitates Determined at High Resolving Power by Tandem Mass Spectrometry Imaging
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- 07 June 2017, pp. 843-848
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- Cited by 12
Characterization of Al and Mg Alloys from Their X-Ray Emission Bands
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- 15 January 2009, pp. 36-45
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- Cited by 12
Nanopillar Fabrication with Focused Ion Beam Cutting
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- Published online by Cambridge University Press:
- 04 July 2014, pp. 1581-1584
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- Cited by 12
Analytical Multimode Scanning and Transmission Electron Imaging and Tomography of Multiscale Structural Architectures of Sulfur Copolymer-Based Composite Cathodes for Next-Generation High-Energy Density Li–S Batteries
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- 24 November 2016, pp. 1198-1221
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- Cited by 12
AFM In-Situ Characterization of Supported Phospholipid Layers Formed by Vesicle Fusion
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- 30 December 2005, pp. 90-93
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- Cited by 11
Contribution of Electron and Confocal Microscopy in the Study of Leishmania–Macrophage Interactions
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- 01 October 2004, pp. 656-661
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- Cited by 11
Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
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- 25 June 2021, pp. 794-803
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- Cited by 11
Practical Aspects of Removing the Effects of Elastic and Thermal Diffuse Scattering from Spectroscopic Data for Single Crystals
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- 23 April 2014, pp. 1078-1089
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- Cited by 11
Improving Energy Resolution of EELS Spectra by Deconvolution using Maximum-Entropy and Richardson-Lucy Algorithms
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- 24 July 2003, pp. 832-833
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Atomic Structure of Thin MoSe2 Films Grown by Molecular Beam Epitaxy
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- 27 August 2014, pp. 164-165
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- Cited by 11
Atomic Force Microscopy Dissects the Hierarchy of Genome Architectures in Eukaryote, Prokaryote, and Chloroplast
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- 18 January 2007, pp. 3-12
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