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Characterization of Al and Mg Alloys from Their X-Ray Emission Bands

Published online by Cambridge University Press:  15 January 2009

Philippe Jonnard ,
Karine Le Guen ,
Raynald Gauvin  and
Jean-François Le Berre
Philippe Jonnard*
Affiliation:
UPMC Univ Paris 06, CNRS-UMR 7614, Laboratoire de Chimie Physique - Matière et Rayonnement, 11 rue Pierre et Marie Curie, F-75231 Paris cedex 05, France
Karine Le Guen
Affiliation:
UPMC Univ Paris 06, CNRS-UMR 7614, Laboratoire de Chimie Physique - Matière et Rayonnement, 11 rue Pierre et Marie Curie, F-75231 Paris cedex 05, France
Raynald Gauvin
Affiliation:
Department of Materials Engineering, McGill University, 3610 University Street, Montréal, Québec H3A 2B2, Canada
Jean-François Le Berre
Affiliation:
Department of Materials Engineering, McGill University, 3610 University Street, Montréal, Québec H3A 2B2, Canada
*
Corresponding author. E-mail: philippe.jonnard@upmc.fr
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Abstract

The valence states of Mg-Al alloys are compared to those of reference materials (pure Mg and Al metals, and intermetallics). Two methods based on X-ray emission spectroscopy are proposed to determine the phases and their proportion: first, by analyzing the Al valence spectra of the Mg-rich alloys and the Mg valence spectra of the Al-rich alloys; second, by fitting with a linear combination of the reference spectra the Al spectra of the Al-rich alloys and the Mg spectra of the Mg-rich alloys. This enables us to determine that Al and Al3Mg2 are present in the 0–43.9 wt% Al composition range and Mg and Al12Mg17 are present in the 62.5–100 wt% Al composition range. In the 43.9–62.5% Al range, the alloy is single phase and an underestimation of the Al content of the alloy can be estimated from the comparison of the bandwidth of the alloy spectrum to the bandwidths of the reference spectra.

Keywords

alloysintermetallicselectronic structurevalence statesX-ray emission spectroscopy
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 15 , Issue 1 , February 2009 , pp. 36 - 45
Copyright
Copyright © Microscopy Society of America 2009

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