Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 5
Fluorescence Quenching by Colloidal Heavy Metals: Implications for Correlative Fluorescence and Electron Microscopy Studies
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- Published online by Cambridge University Press:
- 16 July 2003, pp. 1194-1195
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- Cited by 5
Minerals from the Kakanui Volcanic Breccia: A 2017 Look at Geological Reference Materials for EPMA
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 502-503
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- Cited by 5
Multi-Sun EELS: Ultra-High Energy Resolution combined with High Spatial Resolution and High Beam Current
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- Published online by Cambridge University Press:
- 22 July 2022, pp. 2640-2642
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- Cited by 5
Ultrastructure of Antennal Morphology and Sensilla of Teak Skeletonizer, Eutectona machaeralis Walker (Lepidoptera: Crambidae)
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- 14 October 2020, pp. 1274-1282
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- Cited by 5
Phenom Desktop SEM for Gunshot Residue and Cathodoluminescence Imaging and Analysis
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- 04 August 2017, pp. 1074-1075
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- Cited by 5
Full-Field Hard X-Ray Microscope Designed for Materials Science Applications
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- 10 August 2018, pp. 226-227
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Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM
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- 05 August 2019, pp. 1938-1939
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Development and Deployment of Automated Machine Learning Detection in Electron Microcopy Experiments
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- 30 July 2021, pp. 2136-2137
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- Cited by 5
Towards a Quantitative Understanding in Electron Tomography
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- 26 July 2009, pp. 602-603
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Comparative Performance of SDD-EDS and WDS Detectors for Quantitative Analysis of Mineral Specimens: The Next Generation Electron Microprobe
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- 27 August 2014, pp. 692-693
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Nanometer Scale Tomographic Investigation of Fine Scale Precipitates in a CuFeNi Granular System by Three-Dimensional Field Ion Microscopy
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- 02 October 2012, pp. 1129-1134
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- Cited by 5
Ptychography with a Virtually Enlarged Illumination.
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- 10 August 2018, pp. 46-47
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In situAnalytical TEM of Asphaltene Formation and Aggregation from Crude Oil
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- 25 July 2016, pp. 796-797
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The Influence of Beam Convergence Angle on Channeling Effect during STEM/EDS Quantification of SiGe Concentration
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- 25 July 2016, pp. 1618-1619
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Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future
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- 08 April 2017, pp. 672-673
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Probing Ferroelectric Behavior in Sub-10 nm Bismuth-Rich Aurivillius Films by Piezoresponse Force Microscopy
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- 01 December 2021, pp. 1396-1406
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Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage
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- 01 August 2004, pp. 970-971
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A New High Performance Electron Energy Loss Spectrometer for use with Monochromated Microscopes
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- 02 July 2020, pp. 908-909
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Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques
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- 14 September 2015, pp. 1644-1648
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Real-time cryo-EM structure determination
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- 30 July 2021, pp. 1156-1157
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