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Multi-Sun EELS: Ultra-High Energy Resolution combined with High Spatial Resolution and High Beam Current

Published online by Cambridge University Press:  22 July 2022

N. Dellby
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
O.L. Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA Department of Physics, Arizona State University, Tempe AZ, USA
N.J. Bacon
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
G.J. Corbin
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
N. Johnson
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
R. Hayner
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
P. Hrncrik
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
B. Plotkin-Swing
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
D. Taylor
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
Z.S. Szilaygi
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA
T.C. Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St, Kirkland, WA, USA

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Copyright
Copyright © Microscopy Society of America 2022

References

Krivanek, OL, et al. , Nature 514 (2014), p. 209.CrossRefGoogle Scholar
Hachtel, J, et al. , Science 363 (2019), p. 525.CrossRefGoogle Scholar
Yan, X, et al. , Nature 589 (2021), p. 65.CrossRefGoogle Scholar
Hage, FS, et al. , Science 367 (2019), p. 1124.CrossRefGoogle Scholar
Lagos, MJ, et al. , Microscopy 71 (2022), p. i174.CrossRefGoogle Scholar
Lovejoy, TC, et al. , Microsc. Microanal. 24(S1) (2018), p. 446.CrossRefGoogle Scholar
Rez, P, et al. , Nature communications 7 (2016), p. 10945.CrossRefGoogle Scholar
Tiemeijer, PC, et al. , Ultramicroscopy 114 (2012), p. 72.CrossRefGoogle Scholar
Andersen, WHJ., et al. , J. Phys. E: Sci. Instrum. 3 (1970), p. 121CrossRefGoogle Scholar
Plotkin-Swing, B, et al. , Microsc. Microanal. 27(S1) (2021), p. 136.CrossRefGoogle Scholar
Miyata, T et al. , Microscopy 63 (2014), p. 377.CrossRefGoogle ScholarPubMed