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Full-Field Hard X-Ray Microscope Designed for Materials Science Applications

Published online by Cambridge University Press:  10 August 2018

Imke Greving*
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Silja Flenner
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Emanuel Larsson
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Malte Storm
Affiliation:
Diamond Light Source, Didcot, UK
Fabian Wilde
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Erica Lilleodden
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Thomas Dose
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Hilmar Burmester
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Lars Lottermoser
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
Christian David
Affiliation:
Paul Scherrer Institue, Villigen, Switzerland
Felix Beckmann
Affiliation:
Institute of Materials Research, Helmholtz Zentrum Geesthacht, Geesthacht, Germany
*
*Imke Greving, imke.greving@hzg

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Wilde, F., et al, AIP Conf. Ser. 1741 2016 030035), 14.Google Scholar
[2] Greving, I., et al, J. of Phys.: Conf. Ser. 849 2017 012056.Google Scholar
[3] Gursoy, D., et al, Scientific Reports vol. 7 2017 11818.CrossRefGoogle Scholar
[4] Brun, F., et al, Nucl. Instr. M. Phys. Res. Sect. Acce. Sp. Det. Assoc. Equ. 615 2010 326332.Google Scholar
[5] Hu, K., et al, Philosophical Magazine 96 2016) p. 33223335.CrossRefGoogle Scholar
[6] The authors I.G., E.L. and S.F. acknowledge financial support from the German Research Foundation (DFG) via the SFB 986-M3, projects B2 and Z2..Google Scholar