Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 5
Nanotomography of Inverse Photonic Crystals Using Zernike Phase Contrast
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 146-147
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- Cited by 5
Two-photon NAD(P)H and one-photon Flavoprotein autofluorescence imaging to examine the metabolic mechanisms of pancreatic islet beta-cell function
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- Published online by Cambridge University Press:
- 01 August 2003, pp. 218-219
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- Cited by 5
Analysis of Electron Channeling Contrast of Stacking Faults in fcc Materials
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- Published online by Cambridge University Press:
- 22 January 2021, pp. 318-325
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- Cited by 5
Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorption
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- Published online by Cambridge University Press:
- 25 November 2021, pp. 123-137
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- Cited by 5
Advanced electron microscopy study of fission product distribution in the failed SiC layer of a neutron irradiated TRISO coated particle
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- Published online by Cambridge University Press:
- 23 September 2015, pp. 747-748
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- Cited by 5
Liquid Cell TEM of the Corrosion of Metal Films in Aqueous Solutions
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- Published online by Cambridge University Press:
- 23 November 2012, pp. 1110-1111
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Crystal Growth Mode Changes during Pulsed Laser Induced Rapid Solidification in Nanoscale Thin Films of Al-Cu Eutectic
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1662-1663
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3D Materials Characterization using Dual-Beam FIB/SEM Techniques
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- 01 August 2004, pp. 1128-1129
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Secondary Electron Energy Contrast of Localized Buried Charge in Metal–Insulator–Silicon Structures
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- 02 October 2018, pp. 453-460
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- Cited by 5
Defining HRTEM Resolution: Why Youngs Fringes Don't Measure Resolution
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- 26 July 2009, pp. 1470-1471
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- Cited by 5
Ana Heva lava tube (Easter Island, Chile): Preliminary characterization of the internal layers of coralloid-type speleothems
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- Published online by Cambridge University Press:
- 10 September 2015, pp. 68-69
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Quantitative Chemical Analysis of Sub-Micron Phase Segregation In Polyurethane Polymers by Soft X-Ray Spectromicroscopy
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 909-910
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- Cited by 5
Atom Probe Field Ion Microscopy of High Resistivity Materials
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 90-91
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- Cited by 5
Low-Cost Nanomanipulator for In Situ Experiments in a SEM
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- Published online by Cambridge University Press:
- 30 May 2006, pp. 311-316
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Studies of Hexagonal Pt and Au Nanocluster Superlattices
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 734-735
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An Application of High-Resolution Dual-Lens Dark-Field Electron Holography in Strain Analysis for Nanometer Semiconductor Device in Wafer-foundries
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 1490-1491
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- Cited by 5
Design of a New 8k x 8k Lens Coupled Detector for Wide-field, High-resolution Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 610-611
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- Cited by 5
In situAnalytical TEM of Asphaltene Formation and Aggregation from Crude Oil
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- 25 July 2016, pp. 796-797
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Nanometer Scale Tomographic Investigation of Fine Scale Precipitates in a CuFeNi Granular System by Three-Dimensional Field Ion Microscopy
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- 02 October 2012, pp. 1129-1134
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Towards a Quantitative Understanding in Electron Tomography
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 602-603
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