Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage

R. Wepf; T. Richter; M. Sattler; A. Kaech

doi:10.1017/S1431927604887713

Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage

Published online by Cambridge University Press: 01 August 2004

R. Wepf ,

T. Richter ,

M. Sattler and

A. Kaech

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R. Wepf: Affiliation:
R&D Beiersdorf AG, Germany
T. Richter: Affiliation:
R&D Beiersdorf AG, Germany
M. Sattler: Affiliation:
R&D Beiersdorf AG, Germany
A. Kaech: Affiliation:
Bal-Tec AG, Liechtenstein

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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type: Research Article
Information: Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 970 - 971

DOI: https://doi.org/10.1017/S1431927604887713 [Opens in a new window]

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Improvements for HR- and Cryo-SEM by the VCT 100 High-Vacuum Cryo Transfer System and SEM Cooling Stage

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