Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advances in Image Processing, Display and Analysis

Abstract

Noise Removal by Crystallographic Averaging and Information Content of an Image With Respect to Detections of Plane Symmetries

Landyne - a Software Suite for Electron Diffraction Simulation and Analysis

MIPAR™: 2D and 3D Image Analysis Software Designed for Materials Scientists, by Materials Scientists

Silver Nanowire Diameter and Yield Characterization by High-Throughput SEM and Image Analysis

Image Processing and Analysis for Characterization of Patterns in Polystyrene Foam.

An Evaluation of Image Quality Metrics for Scanning Electron Microscopy

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract

Multi-Beam Scanning Electron Microscope Design

Selective Detection of Backscattered Electrons in the Compound Lens Equipped UHR SEM

Design of an Ultra-High Resolution SEM for Enhanced Analysis

Miniature Electron Beam Columns: From the Lab to the Field

Imaging a 1 mm3Volume of Rat Cortex Using a MultiBeam SEM

Multi-beam Electron Microscopy: Principles and Applications

Patterned Wafer Inspection with Multi-beam SEM Technology

Towards Enhancing the Throughput and Eliminating the 4 Dimensions of Stitching Errors in Large Area, High Resolution SEM for Integrated Circuit Reverse Engineering and Connectomics

IPrep – Automated Serial-Section Broad-Ion-Beam Tomography

Silicon Photomultipliers: Properties, Latest Developments at FBK and Applications.

Figure of Merit of Silicon Photomultiplier/Scintillator Electron Detector

Real-World Electron Detector Performance in Scanning Electron Microscopes

How New Electron Detector Concepts Can Help to Increase Throughput and Sensitivity of Single-and Multi-Beam Scanning Electron Microscopes

Nanoscale Imaging of Structural and Optical Properties Using Helium Temperature Scanning Transmission Electron Microscopy Cathodoluminescence of Nitride Based Nanostructures

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advances in Image Processing, Display and Analysis

Abstract

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract