Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract

Nanoscale Strain Mapping During in situ Deformation of Annealed Al-Mg Alloys

De-coupling Anelastic and Elastic Deformation in Metallic Glass Thin Films via Measurement of Micro Strain Tensors Using in situ Electron Diffraction

Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

Fast Scanning Electron Diffraction and Electron Holography as Methods to Acquire Structural Information on Au102(p-MBA)44 Nanoclusters

Developing Rapid and Advanced Visualisation of Magnetic Structures Using 2-D Pixelated STEM Detectors

Advances in Image Processing, Display and Analysis

Abstract

Model-Based Super-Resolution of SEM Images of Nano-Materials

Self–Organizing Neural Networks: Parallels Between “Big Imaging” and Sparse Imaging in Electron Microscopy

Automatic Neural Reconstruction from Petavoxel of Electron Microscopy Data

High-Throughput, Automated Image Processing for Large-Scale Fluorescence Microscopy Experiments

Measuring and Visualizing Clonal Development in Live Cell and Tissue Microscopy

Interactive Web-based Spatio-Statistical Image Modeling from Gigapixel Images to Improve Discovery and Traceability of Published Statistical Models

Image Texture Analysis and Application to Acicular Mullite Porous Ceramic Microstructure

Studying the Atomic Structures by Aberration-Corrected and Conventional Electron Microscopy

A Precise Description of Inorganic Nanoparticles in HRTEM Micrographs

Unambiguous Detections of The Plane Symmetries That Noisy Experimental Images from Naturally Formed 2D Periodic Arrays of Physical Objects Most Likely Possess

Advances in Mapping Periodic Structural Modulations of Atomic Lattices

Dictionary-based Filling of the Missing Wedge in Electron Tomography

An “Extra Dimension” in Electron Tomography: Automatic Parameter Determination for Next-generation Reconstruction Methods

Practical Implementation of Compressive Sensing for High Resolution STEM

Compressive STEM-EELS

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution

Abstract

Advances in Image Processing, Display and Analysis

Abstract