Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Research and Applications in Atom Probe Tomography

Abstract

On the Accuracy of Compositional Quantification for Atom Probe Tomography

Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries

Atom Probe Tomography of Interfacial Segregation in CdTe-based Solar Cells

Experimental Evaluation of the Interrelationships Between Laser Energy, Temperature, Applied Bias, and Measured Composition in Laser Pulsed Atom Probe Tomography

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography

Correlated Atom-Probe Tomography and Transmission Electron Microscopy of Meteoritic Nanodiamonds

Oxide Scales Revealed by Atom Probe Tomography.

The Mystery of Missing Species in Atom Probe Tomography of Composite Materials

Impact of Extreme Electrical Fields on Charge Density Distributions in Alloys

Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography

Approaches for Promoting Accurate Atom Probe Reconstruction

A Round Robin Experiment: Analysis of Solute Clustering from Atom Probe Tomography Data.

Characterizing Alnico Alloy by Correlative STEM-EDS Tomography and Atom Probe Tomography

Spinodal Decomposition in an Alnico Alloy

Designing and characterizing a complex concentrated gamma/gamma prime ‘superalloy’

Grain Boundary Segregation and Core/Shell Structured Nanofeatures in Oxide-Dispersion Strengthened Fe-Cr Alloys

Mechanisms of Particle Coarsening and Phase Transformation in Oxide Dispersion Strengthened Steels During Friction Stir Welding

Field Evaporation Behavior of Metal Oxide/Metal Interfaces

Using Ma ss Resolving Power as a Performance Metric in the Atom Probe

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Research and Applications in Atom Probe Tomography

Abstract