Microscopy and Microanalysis: Volume 22 - Proceedings of Microscopy & Microanalysis 2016

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Research and Applications in Atom Probe Tomography

Abstract

Correlative t-EBSD Tomography and Atom Probe Tomography Analysis

Correlative Analysis using FIB-ToF-SIMS and Atom Probe Tomography on Geological Materials

The Nanolathe - a Dedicated Two-axis Positioner for Concentric Sample Rotation.

The Effect of Group 5 (V, Nb, Ta) Additions on Precipitation in Al-Sc Alloys

Collected Data Set Size Considerations for Atom Probe Cluster Analysis

Comparing Plasma-FIB and Ga-FIB Preparation of Atom Probe Tomography Samples

Preparation and Characterization of Eu-Doped Diamond Samples by Atom Probe Tomography

Application of Atom Probe on Fully Depleted Silicon-On-Insulator (FDSOI) Structures

Modeling Degradation of Metallic Surfaces By First Principles Calculations: A Case Study for Al, Au, Ag, and Pd

Extracting Chemistry – Property Relationships by Mining Atom Probe Evaporation Events

Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy

DirectIn situObservation of Tempering-induced Austenite Decomposition and Atom Probe Analyses ofk-Carbide Precipitates in Lightweight Fe-Mn-Al-C Steels

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract

Beyond Movie Mode: Bridging the Gap of Time Resolution

Pump-Probe and Time-Resolved Electron Microscopy and Big Data Analysis of Electron-Lattice Dynamics in Strongly Correlated Electron Systems

Local strain measurements during in situ TEM deformation with nanobeam electron diffraction

Probing Stress-Induced Grain Boundary Migration and Hypofriction at High Resolution

Structural Dynamics of Supported Metal Nanoparticles

Recent Advancement of Environmental TEM for Material Process Characterization

Automated Image Processing Scheme to Measure Atomic-Scale Structural Fluctuations

Fast Atomic-Scale Chemical Imaging by STEM EDS for Study of Crystalline Materials and Dynamic Phase Transformations

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2016

Analytical and Instrumentation Science Symposia

Research and Applications in Atom Probe Tomography

Abstract

In-Situ Electron Microscopy and Big Data Analytics in 2D and 3D

Abstract