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Correlative t-EBSD Tomography and Atom Probe Tomography Analysis

Published online by Cambridge University Press:  25 July 2016

Y. Chen ,
K.P. Rice ,
T.J. Prosa ,
M.M. Nowell  and
S.I. Wright
Y. Chen
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
K.P. Rice
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., Madison, WI, USA
M.M. Nowell
Affiliation:
EDAX, Draper, UT, USA
S.I. Wright
Affiliation:
EDAX, Draper, UT, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 682 - 683
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Arslan, I., et al, Ultramicroscopy 108.12 (2008). p. 1579.Google Scholar
[2] Rice, K.P., Keller, R.R. & Stoykovich, M.P. Journal of Microscopy 254 (2014). p. 129.Google Scholar
[3] Babinsky, K., et al, Ultramicroscopy 159(2 (2015). p. 445.Google Scholar