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Design of an Ultra-High Resolution SEM for Enhanced Analysis

Published online by Cambridge University Press:  25 July 2016

Jaroslav Jiruse ,
Miloslav Havelka  and
Jan Polster
Jaroslav Jiruse
Affiliation:
TESCAN Brno, Brno, Czech Republic
Miloslav Havelka
Affiliation:
TESCAN Brno, Brno, Czech Republic
Jan Polster
Affiliation:
TESCAN Brno, Brno, Czech Republic

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 578 - 579
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Jiruse, J, et al, Microsc. Microanal 19(Suppl 2 (2013). p 1302.CrossRefGoogle Scholar
[2] Shao, Z & Lin, PSD Rev. Sci. Instrum 60(11 (1989). p 3434.CrossRefGoogle Scholar
[3] Jiršse, J, et al, Ultramicroscopy 146(27 (2014).Google Scholar
[4] Stolcova, L, et al, Imaging & Microscopy, (Issue 4, (2015), p 34.Google Scholar