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Noise Removal by Crystallographic Averaging and Information Content of an Image With Respect to Detections of Plane Symmetries

  • Peter Moeck (a1), Andrew Dempsey (a1) and Jack C. Straton (a1)
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[1] Zou, X., Hovmöller, S. & Oleynikov, P. Electron Crystallography: Electron Microscopy and Electron Diffraction, IUCr Texts on Crystallography 16 , (Oxford University Press (2011).
[2] Neiner, D., et al., J. Am. Chem. Soc 129 (2007) 1385713862.
[3] Moeck, P. in: Microscopy: Science Technology, Applications and Education 3 (2010) 19511962.
[4] Moeck, P., et al., Proc. 11th IEEE Intern. Conf. Nanotech (2011) 891896. doi:10.1109/NANO.2011.6144508.
[5] Straton, J. C., et al., Cryst. Res. Technol. 49 (2014) 663-680; Adv. Struct. Chem. Imaging 1 (2015) 14.
[6] Park, S. & Quate, C. F. J. Appl. Phys 62 (1987) 312314.
[7] Mazur, U., et al., J. Phys. Chem. B 108 (2004) 1700317006.
[8] Kanatani, K. Intern. J. Comp. Vision 26 (1998) 171189.
[9] The first author acknowledges funding from Portland State University's Faculty Enhancement program.

Noise Removal by Crystallographic Averaging and Information Content of an Image With Respect to Detections of Plane Symmetries

  • Peter Moeck (a1), Andrew Dempsey (a1) and Jack C. Straton (a1)

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