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Electronic speckle pattern shearing interferometry for determining free convection heat transfer coefficient

Published online by Cambridge University Press:  15 June 1999

G. Schirripa Spagnolo ,
D. Ambrosini  and
D. Paoletti
G. Schirripa Spagnolo*
Affiliation:
INFM – Dipartimento di Ingegneria Elettronica, Università di Roma Tre, via Della Vasca Navale 84, 00146 Roma, Italy
D. Ambrosini
Affiliation:
INFM – Dipartimento di Energetica, Università di L'Aquila, Loc. Monteluco di Roio, 67040 Roio Poggio (AQ), Italy
D. Paoletti
Affiliation:
INFM – Dipartimento di Energetica, Università di L'Aquila, Loc. Monteluco di Roio, 67040 Roio Poggio (AQ), Italy
*
Giuseppe.Schirripa@ele.uniroma3.it
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Abstract

An electronic speckle-pattern shearing interferometer (ESPSI) is proposed formeasuring the free convection heat transfer coefficient in liquids. The heattransfer coefficient may be deduced by a simple manipulation of the specklepatterns. Theory of the method as well as its application are presented. Themethod is robust and easy to use for non-skilled operators.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 6 , Issue 3 , June 1999 , pp. 281 - 284
Copyright
© EDP Sciences, 1999

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