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Unimolecular Electrical Rectification Down to 105 K, and Spectroscopy of Hexadecylquinolinium Tricyanoquinodimethanide

Published online by Cambridge University Press:  21 March 2011

R. M. Metzger
R. M. Metzger*
Affiliation:
Laboratory for Molecular Electronics, Chemistry Department, University of Alabama, Tuscaloosa, AL 35487-0336, USA, rmetzger@bama.ua.edu
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Abstract

A Langmuir-Blodgett monolayer of γ-(n-hexadecyl)quinolinum tricyanoquinodimethanide, C16H33Q-3CNQ (1), sandwiched between Al electrodes, shows asymmetric DC electrical conductivity between 370 K and 105 K. The enhanced forward current is attributable to rectification of electrical current by a single molecule, and is explained by an electronic transition from a high-moment zwitterionic ground state to a low-moment undissociated first excited state.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 582: Symposium H – Molecular Electronics , 1999 , H12.2
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1. Aviram, A. and Ratner, M. A., Chem. Phys. Lett. 29: 277 (1974).Google Scholar
2. Metzger, R. M. and Panetta, C. A., New J. Chem. 15: 209 (1991).Google Scholar
3. Metzger, R. M., In Molecular and Biomolecular Electronics, Birge, R. R., Ed., ACS Adv. in Chem. Ser. 240 (American Chemical Society, Washington, DC 1994) p.81.Google Scholar
4. Metzger, R. M., Mater. Sci. & Engrg. C3: 277 (1995).Google Scholar
5. Geddes, N. J., Sambles, J. R., Jarvis, D. J., Parker, W. G. and Sandman, D. J., Appl. Phys. Lett. 56: 1916 (1990).Google Scholar
6. Geddes, N. J., Sambles, J. R., Jarvis, D. J., Parker, W. G. and Sandman, D. J., J. Appl. Phys. 71: 756 (1992).Google Scholar
7. Metzger, R. M., Heimer, N. E. and Ashwell, G. J., Mol. Cryst. Liq. Cryst. 107: 133 (1984).Google Scholar
8. Ashwell, G. J., Szablewski, M. and Kuczynski, A. P., in Metzger, R. M., Day, P., and Papavassiliou, G. C., Eds., Lower-Dimensional Systems and Molecular Electronics, NATO ASI Series (Plenum, New York, 1991) B248, p. 647.Google Scholar
9. Ashwell, G. J., in Ashwell, G. J. and Bloor, D., Eds. Organic Materials for Nonlinear Optics, (Royal Soc. of Chem., Cambridge, 1993), p.31.Google Scholar
10. Ashwell, G. J., Sambles, J. R., Martin, A. S., Parker, W. G. and Szablewski, M., J. Chem. Soc. Chem. Comm. 1374 (1990).Google Scholar
11. Martin, A. S., Sambles, J. R. and Ashwell, G. J., Phys. Rev. Lett. 70: 218 (1993).Google Scholar
12. Wu, X.-L., Shamsuzzoha, M., Metzger, R. M. and Ashwell, G. J., Synth. Metals 55–57: 3836 (1993).Google Scholar
13. Metzger, R. M., Tachibana, H., Wu, X., Höpfner, U., Chen, B., Lakshmikantham, M. V. and Cava, M. P., Synth. Metals 85: 1359 (1997).Google Scholar
14. Metzger, R. M., Chen, B., Höpfner, U., Lakshmikantham, M. V., Vuillaume, D., Kawai, T., Wu, X., Tachibana, H., Hughes, T. V., Sakurai, H., Baldwin, J. W., Hosch, C., Cava, M. P., Brehmer, L. and Ashwell, G. J., J. Am. Chem. Soc. 119: 10455 (1997).Google Scholar
15. Chen, B. and Metzger, R. M., J. Phys. Chem. B103: 4447 (1999).Google Scholar
16. Vuillaume, D., Chen, B., and Metzger, R. M., Langmuir 15: 4011 (1999).Google Scholar
17. Baldwin, J. W., Chen, B., Street, S. C., Konovalov, V. V., Sakurai, H., Hughes, T. V., Simpson, C. S., Lakshmikantham, M. V., Cava, M. P., Kispert, L. D., and Metzger, R. M., J. Phys. Chem. B103: 4269 (1999).Google Scholar
18. Kwon, O., McKee, M. L., and Metzger, R. M., Chem. Phys. Letters 313: 321 (1999).Google Scholar
19. Metzger, R. M., Chen, B., Vuillaume, D., Höpfner, U., Baldwin, J. W., Kawai, T., Tachibana, H., Sakurai, H., Lakshmikantham, M. V., and Cava, M. P., MRS Proceedings 488: 335 (1998).Google Scholar
20. Metzger, R. M., Chen, B., Vuillaume, D., Lakshmikantham, M. V., Höpfner, U., Kawai, T., Baldwin, J. W., Wu, X., Tachibana, H., Sakurai, H., and Cava, M. P., Thin Solid Films 327–329: 326 (1998).Google Scholar
21. Metzger, R. M. and Cava, M. P., Ann. N. Y. Acad. Sci. 852: 95 (1998).Google Scholar
22. Metzger, R. M., Adv. Mater. Optics & Electronics 8: 229 (1998).Google Scholar
23. Metzger, R. M., Mol. Cryst. Liq. Cryst., accepted and in press.Google Scholar
24. Metzger, R. M., J. Materials Chem. 9: 2027 (1999).Google Scholar
25. Metzger, R. M., J. Materials Chem, accepted and in press.Google Scholar
26. Metzger, R. M., Synth. Metals, accepted and in press.Google Scholar
27. Metzger, R. M., Acc. Chem. Res. 32: 950 (1999).Google Scholar
28. Chen, B., Ph.D. dissertation, University of Alabama (1999).Google Scholar
29. Hughes, T. V., Mokijewski, B., Chen, B., Lakshmikantham, M. V., Cava, M. P., and Metzger, R. M., Langmuir 15: 6295 (1999).Google Scholar
30. Brady, A. C., Hodder, B., Martin, A. S., Sambles, J. R., Ewels, C. P., Jones, R., Briddon, P. R., Musa, A. M., Panetta, C. A., and Mattern, D. L., J. Mater. Chem. 9: 2271 (1999).Google Scholar