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Texture by the kilometer

Published online by Cambridge University Press:  18 March 2011

E. D. Specht  and
F. A. List
E. D. Specht
Affiliation:
Metals and Ceramics Division, Oak Ridge National LaboratoryOak Ridge, TN 37831-6118
F. A. List
Affiliation:
Metals and Ceramics Division, Oak Ridge National LaboratoryOak Ridge, TN 37831-6118
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Abstract

A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa2Cu3O7 (YBCO) superconductors.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 689: Symposium E – Materials for High-Temperature Superconductor Technologies , 2001 , E8.21
Copyright
Copyright © Materials Research Society 2002

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References

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