Published online by Cambridge University Press: 10 February 2011
Thick films of scandium-substituted BaScxFe12−xO19 (x=0, 0.4, 0.6) were deposited by pulsed laser ablation deposition onto A-plane (1120) sapphire (Al2O3) substrates to yield highly oriented films having the crystallographic c-axis ([0001]) in the film plane. Selected films were characterized by x-ray diffraction, electron microscopy, magnetometry and torque magnetometry measurements. These structural and magnetic measurements show that dense films have excellent in-plane uniaxial anisotropies and good square loop behaviors. Such films will be useful for planar latched phase shifters that can be integrated into microwave integrated circuits.