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Phase Evolution During Crystallization of an Amorphous TiAl Film

Published online by Cambridge University Press:  11 February 2011

O.N. Senkov
Affiliation:
UES, Inc., 4401 Dayton-Xenia Rd., Dayton, OH 45432–1894
M.D. Uchic
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson, AFB, OH 45433–7817
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Abstract

Phase evolution during crystallization of an amorphous TiAl film produced by physical vapor deposition (PVD) was studied using differential thermal analysis (DTA), x-ray diffraction (XRD), and transmission electron microscopy (TEM). The following sequence of phase transformations was observed during continuous heating from room temperature: amorphous → body centered cubic (β) → hexagonal close-packed (α) → tetragonal (γ) → ordered α2. The β phase was formed as near-spherical particles that were evenly distributed in the amorphous phase, and the size of these particles was approximately 90 nm. Formation of the α phase by decomposition of β and the remaining amorphous phases led to a very fine feathery-like microstructure arranged in colonies of approximately 100 nm in size. The transformation of the metastable α phase into a mixture of the γ and α2 phases led to formation of an equiaxed γ-grain structure with a grain size of about 150 nm after heating to 850°C.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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