Article contents
Infrared Spectroscopy of Intersitial Oxygen in Silicon
Published online by Cambridge University Press: 28 February 2011
Abstract
A discussion of the isotope shift of the low temperature spectrum of the stretching mode of interstitial oxygen (Oi) in silicon introduces IR results showing the interaction of Oi with the silicon lattice. Evidence is given that the temperature dependence of a combination band observed at liquid helium temperature (LHT) at 1205.7 cm−1 is responsible for the room temperature (RT) band at 1227 cm−1 and that a weak band near 1013 cm−1 is an overtone of the 518 cm−1 band.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1986
References
REFERENCES
1.
Bosomworth, D.R., Hayes, W., Spray, A.R.L. and Watkins, G.D., Proc. Roy. Soc. Lond., A.
317, 133 (1970).Google Scholar
5.
Krishnan, A.K. and Hill, S.L., in Fourier Transform Infrared Spectrocopy (1981), p. 27, Sakai, H., Editor, S.P.I.E.
289, S.P.I.E., Bellingham, WA (1981).Google Scholar
6.
Pajot, B., Stein, H.J., Cales, B. and Naud, C., J. Electrom. Soc., 132, 3034 (1985).Google Scholar
9.
Pajot, B. and Bardeleben, J. von, in Proceedings of the 13th Conference on Defects in Semiconductors, edited by Kimerling, L.C. and Parsey, J.M. (Metallurgical Society of AIME, Warrendale, PA, 1985), p. 685.Google Scholar
- 11
- Cited by